Correlation between electrical and ellipsometric properties on high-quality epitaxial thin films of the conductive oxide LaNiO3 on STO (001)

Journal of Applied Physics

Volumn 102, Issue 6, 2007, Pages

  Noun, W ^a   Berini, B ^a   Dumont, Y ^a   Dahoo, P R ^a   Keller, N ^a  

^a LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; LANTHANUM COMPOUNDS; PARTIAL PRESSURE; PULSED LASER DEPOSITION; STOICHIOMETRY;

DIRECT CURRENT (DC) ELECTRICAL TRANSPORT PROPERTIES; ELLIPSOMETRIC PROPERTIES; EPITAXIAL THIN FILMS; SPECTROSCOPIC ELLIPSOMETRIC MEASUREMENTS;

EPITAXIAL FILMS;

EID: 34848880730     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2781517     Document Type: Article

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