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Volumn 94, Issue 22, 2009, Pages

Electronic properties of nanocrystalline LaNiO3 and La 0.5Sr0.5CoO3 conductive films grown on silicon substrates determined by infrared to ultraviolet reflectance spectra

(6) Hu, Z G a Li, W W a Li, Y W a Zhu, M b Zhu, Z Q a Chu, J H a

a EAST CHINA NORMAL UNIVERSITY (China)

b SHANGHAI JIAO TONG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE FORMATION; DIELECTRIC CONSTANTS; ELECTRONIC BAND STRUCTURE; ELECTRONIC TRANSITION; GRAIN SIZE; INTERBAND; LORENTZ FUNCTIONS; METALLIC OXIDES; NANO-STRUCTURED; NANOCRYSTALLINE; OPTICAL REFLECTANCE; PHOTON ENERGY RANGE; REFLECTANCE SPECTRUM; ROOM TEMPERATURE; SILICON SUBSTRATES;

COBALT COMPOUNDS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; INFRARED SPECTROSCOPY; METALLIC COMPOUNDS; METALS; OPTICAL CONDUCTIVITY; OXIDE MINERALS; PEROVSKITE; REFLECTION;

CONDUCTIVE FILMS;

EID: 66749109840 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3148339 Document Type: Article

Times cited : (16)

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