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Volumn 76, Issue 20, 2007, Pages

Reversible phase transformation of LaNi O3-x thin films studied in situ by spectroscopic ellipsometry

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EID: 36148996218     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.205417     Document Type: Article
Times cited : (31)

References (24)
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    • (2002) J. Electroceram. , vol.8 , pp. 243-247
    • Hou, F.1    Qin, Y.2    Xu, T.3    Xu, M.4
  • 22
    • 0025494466 scopus 로고
    • SSCOA4 0038-1098 10.1016/0038-1098(90)90236-5
    • J. P. Kemp and P. A. Cox, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(90)90236-5 75, 731 (1990).
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    • Kemp, J.P.1    Cox, P.A.2
  • 24
    • 0001648638 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.53.3013
    • D. de Ligny and P. Richet, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.53.3013 53, 3013 (1996).
    • (1996) Phys. Rev. B , vol.53 , pp. 3013
    • De Ligny, D.1    Richet, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.