SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 21, Issue 5, 2010, Pages 514-518

Orientation controlling of Pb(Zr 0.53Ti 0.47)O 3 thin films prepared on silicon substrates with the thickness of La 0.5Sr 0.5CoO 3 electrodes

(4) Chen, Feng a Cheng, Jinrong a Yu, Shenwen a Meng, Zhongyan a

a SHANGHAI UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

DENSE COLUMNAR STRUCTURES; DIELECTRIC AND FERROELECTRIC PROPERTIES; DIELECTRIC CONSTANTS; PREFERENTIAL ORIENTATION; PZT; PZT FILM; PZT THIN FILM; REMNANT POLARIZATIONS; SI SUBSTRATES; SILICON SUBSTRATES; SOL-GEL ROUTES;

COBALT COMPOUNDS; FERROELECTRIC FILMS; GELS; LEAD; SEMICONDUCTING SILICON COMPOUNDS; SOL-GEL PROCESS; THIN FILMS; VAPOR DEPOSITION; ZIRCONIUM;

FILM PREPARATION;

EID: 77953324633 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-009-9948-6 Document Type: Article

Times cited : (8)

References (21)

1
- 0000231242
- doi:10.1063/1.365901
- F. Wang, S. Leppāvuori, J. Appl. Phys. 82, 1293 (1997). doi:10.1063/1.365901
- (1997) J. Appl. Phys. , vol.82 , pp. 1293
- Wang, F.¹ Leppavuori, S.²

2
- 0032115490
- doi:10.1016/S0040-6090(98)00486-6
- S.-H. Kim, Y.-S. Choi, C.-E. Kim, D.-Y. Yang, Thin Solid Films 325, 72 (1998). doi:10.1016/S0040-6090(98)00486-6
- (1998) Thin Solid Films , vol.325 , pp. 72
- Kim, S.-H.¹ Choi, Y.-S.² Kim, C.-E.³ Yang, D.-Y.⁴

3
- 34247547993
- 12 layers
- DOI 10.1016/j.matlet.2006.10.071, PII S0167577X06012961
- B.T. Liu, X. Zhang, W.T. Zhang, Z. Yan, C.S. Cheng, F. Li, L. Li, Q.X. Zhao, Mater. Lett. 61, 3045 (2007). doi:10.1016/j.matlet.2006.10.071 (Pubitemid 46654293)
- (2007) Materials Letters , vol.61 , Issue.14-15 , pp. 3045-3047
- Liu, B.T.¹ Zhang, X.² Zhang, W.T.³ Yan, Z.⁴ Cheng, C.S.⁵ Li, F.⁶ Li, L.⁷ Zhao, Q.X.⁸

4
- 79956025673
- 2/Si substrates
- DOI 10.1063/1.1480099
- Y.K. Wang, T.Y. Tseng, P. Lin, Appl. Phys. Lett. 80, 3790 (2002). doi:10.1063/1.1480099 (Pubitemid 34637262)
- (2002) Applied Physics Letters , vol.80 , Issue.20 , pp. 3790
- Wang, Y.K.¹ Tseng, T.Y.² Lin, P.³

5
- 0032621586
- doi:10.1063/1.370832
- C. Schwan, P. Haibach, G. Jakob, J.C. Martíez, H. Adrian, J. Appl. Phys. 86, 960 (1999). doi:10.1063/1.370832
- (1999) J. Appl. Phys. , vol.86 , pp. 960
- Schwan, C.¹ Haibach, P.² Jakob, G.³ Martíez, J.C.⁴ Adrian, H.⁵

6
- 0034274104
- doi:10.1016/S0040-6090(00)01068-3
- X.J. Meng, Z.X. Ma, J.L. Sun, L.X. Bo, H.J. Ye, S.L. Guo, J.H. Chu, Thin Solid Films 372, 271 (2000). doi:10.1016/S0040-6090(00)01068-3
- (2000) Thin Solid Films , vol.372 , pp. 271
- Meng, X.J.¹ Ma, Z.X.² Sun, J.L.³ Bo, L.X.⁴ Ye, H.J.⁵ Guo, S.L.⁶ Chu, J.H.⁷

7
- 34548383516
- La0.8 Sr0.2 MnO3 buffer layer effects on microstructure, leakage current, polarization, and magnetic properties of BiFeO3 thin films
- DOI 10.1063/1.2770960
- S. Habouti, R.K. Shiva, C.-H. Solterbeck, M. Es-Souni, J. Appl. Phys. 102(044113), 044113 (2007). doi:10.1063/1.2770960 (Pubitemid 47354002)
- (2007) Journal of Applied Physics , vol.102 , Issue.4 , pp. 044113
- Habouti, S.¹ Shiva, R.K.² Solterbeck, C.-H.³ Es-Souni, M.⁴ Zaporojtchenko, V.⁵

8
- 0035546584
- Preparation and properties of lanthanum strontium cobalt films on Si(1 0 0) by metallorganic chemical liquid deposition
- DOI 10.1016/S0022-0248(01)01603-7, PII S0022024801016037
- G.S. Wang, Z.Q. Lai, J. Yu, S.L. Guo, J.H. Chu, G. Li, Q.H. Lu, J. Cryst. Growth 233, 512 (2001). doi:10.1016/S0022-0248(01)01603-7 (Pubitemid 32866964)
- (2001) Journal of Crystal Growth , vol.233 , Issue.3 , pp. 512-516
- Wang, G.S.¹ Lai, Z.Q.² Yu, J.³ Guo, S.L.⁴ Chu, J.H.⁵ Li, G.⁶ Lu, Q.H.⁷

9
- 0000713087
- doi:10.1063/1.110717
- S.G. Ghonge, E. Goo, R. Ramesh, T. Sands, V.G. Keramidas, Appl. Phys. Lett. 63, 1628 (1993). doi:10.1063/1.110717
- (1993) Appl. Phys. Lett. , vol.63 , pp. 1628
- Ghonge, S.G.¹ Goo, E.² Ramesh, R.³ Sands, T.⁴ Keramidas, V.G.⁵

10
- 7044254792
- doi:10.1063/1.1794354
- G.-T. Park, J.-J. Choi, C.-S. Park, J.-W. Lee, H.-E. Kim, Appl. Phys. Lett. 85, 2322 (2004). doi:10.1063/1.1794354
- (2004) Appl. Phys. Lett. , vol.85 , pp. 2322
- Park, G.-T.¹ Choi, J.-J.² Park, C.-S.³ Lee, J.-W.⁴ Kim, H.-E.⁵

11
- 0036571968
- 3 films with different Zr/Ti atom ratios
- DOI 10.1063/1.1468905
- J. Cheng, W. Zhu, N. Li, L. Eric Cross, J. Appl. Phys. 91, 5997 (2002). doi:10.1063/1.1468905 (Pubitemid 34562261)
- (2002) Journal of Applied Physics , vol.91 , Issue.9 , pp. 5997
- Cheng, J.¹ Zhu, W.² Li, N.³ Cross, L.E.⁴

12
- 2542466861
- doi:10.1063/1.1738178
- S.H. Hu, X.J. Meng, G.J. Hu, J.H. Chu, N. Dai, Appl. Phys. Lett. 84, 3609 (2004). doi:10.1063/1.1738178
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3609
- Hu, S.H.¹ Meng, X.J.² Hu, G.J.³ Chu, J.H.⁴ Dai, N.⁵

13
- 0035855014
- doi:10.1063/1.1391229
- M. Aratani, T. Oikawa, T. Ozeki, H. Funakubo, Appl. Phys. Lett. 79, 1000 (2001). doi:10.1063/1.1391229
- (2001) Appl. Phys. Lett. , vol.79 , pp. 1000
- Aratani, M.¹ Oikawa, T.² Ozeki, T.³ Funakubo, H.⁴

14
- 2542446632
- doi:10.1016/j.tsf.2003.12.074
- V.C. Lo, K.H. Wong, K.S. So, Thin Solid Films 458, 336 (2004). doi:10.1016/j.tsf.2003.12.074
- (2004) Thin Solid Films , vol.458 , pp. 336
- Lo, V.C.¹ Wong, K.H.² So, K.S.³

15
- 0344490389
- doi:10.1016/S0167-9317(02)00988-7
- T. Kiguchi, N. Wakiya, K. Shinozaki, N. Mizutani, Microelectron. Eng. 66, 708 (2003). doi:10.1016/S0167-9317(02)00988-7
- (2003) Microelectron. Eng. , vol.66 , pp. 708
- Kiguchi, T.¹ Wakiya, N.² Shinozaki, K.³ Mizutani, N.⁴

16
- 0032607931
- doi:10.1063/1.371114
- C.R. Cho, W.J. Lee, B.G. Yu, B.W. Kim, J. Appl. Phys. 86, 2700 (1999). doi:10.1063/1.371114
- (1999) J. Appl. Phys. , vol.86 , pp. 2700
- Cho, C.R.¹ Lee, W.J.² Yu, B.G.³ Kim, B.W.⁴

17
- 0035914871
- doi:10.1063/1.1419234
- G.S. Wang, X.J. Meng, J.L. Sun, Z.Q. Lai, J. Yu, S.L. Guo, J.G. Cheng, J. Tang, J.H. Chu, Appl. Phys. Lett. 79, 3476 (2001). doi:10.1063/1.1419234
- (2001) Appl. Phys. Lett. , vol.79 , pp. 3476
- Wang, G.S.¹ Meng, X.J.² Sun, J.L.³ Lai, Z.Q.⁴ Yu, J.⁵ Guo, S.L.⁶ Cheng, J.G.⁷ Tang, J.⁸ Chu, J.H.⁹

18
- 33645241121
- doi:10.1063/1.2177430
- C. Wang, M. Takahashi, H. Fujino, X. Zhao, E. Kume, T. Horiuchi, S. Sakai, J. Appl. Phys 99, 054104 (2006). doi:10.1063/1.2177430
- (2006) J. Appl. Phys , vol.99 , pp. 054104
- Wang, C.¹ Takahashi, M.² Fujino, H.³ Zhao, X.⁴ Kume, E.⁵ Horiuchi, T.⁶ Sakai, S.⁷

19
- 0031078767
- doi:10.1557/JMR.1997.0066
- R.W. Schwartz, J.A. Voigt, B.A. Tuttle, D.A. Payne, T.L. Reichert, R.S. Dasalla, J. Mater. Res. 12, 444 (1997). doi:10.1557/JMR.1997.0066
- (1997) J. Mater. Res. , vol.12 , pp. 444
- Schwartz, R.W.¹ Voigt, J.A.² Tuttle, B.A.³ Payne, D.A.⁴ Reichert, T.L.⁵ Dasalla, R.S.⁶

20
- 0030214464
- Texture evolution and electrical properties of oriented PZT thin films
- DOI 10.1016/0254-0584(96)80095-2
- S.Y. Chen, Mater. Chem. Phys 45(2), 159 (1996). doi:10.1016/0254-0584(96) 80095-2 (Pubitemid 126359135)
- (1996) Materials Chemistry and Physics , vol.45 , Issue.2 , pp. 159-162
- Chen, S.-Y.¹

21
- 0000828024
- doi:10.1021/cm970286f
- R.W. Schwartz, Chem. Mater. 9, 2325 (1997). doi:10.1021/cm970286f
- (1997) Chem. Mater. , vol.9 , pp. 2325
- Schwartz, R.W.¹

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