Preparation and properties of lanthanum strontium cobalt films on Si(1 0 0) by metallorganic chemical liquid deposition

Journal of Crystal Growth

Volumn 233, Issue 3, 2001, Pages 512-516

  Wang, G S ^a   Lai, Z Q ^a   Yu, J ^a   Guo, S L ^a   Chu, J H ^a   Li, G ^b   Lu, Q H ^b  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

A1. X ray diffraction; B1. perovskites; B2. oxide superconducting materials

Indexed keywords

CRYSTALLIZATION; FILM GROWTH; HYSTERESIS; LANTHANUM COMPOUNDS; PEROVSKITE; RAPID THERMAL ANNEALING; SUPERCONDUCTING MATERIALS; X RAY DIFFRACTION ANALYSIS;

METALLORGANIC CHEMICAL LIQUID DEPOSITION (MOCLD);

THIN FILMS;

EID: 0035546584     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01603-7     Document Type: Article

References (16)