Studies on structural and electrical properties of sprayed SnO 2:Sb films

Journal of Crystal Growth

Volumn 276, Issue 1-2, 2005, Pages 215-221

  Elangovan, E ^a,b,c   Shivashankar, S A ^b   Ramamurthi, K ^a,b  

^a BHARATHIDASAN UNIVERSITY   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

^c DEPARTAMENTO DE CIÊNCIA DOS MATERIAIS   (Portugal)

Author keywords

A1. Atomic force microscopy; A1. X ray diffraction; B1. Oxides; B2. Semiconducting materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; DOPING (ADDITIVES); ELECTRIC PROPERTIES; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SPRAYING; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

FILM ROUGHNESS; HALL MOBILITY; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES;

THIN FILMS;

EID: 20344361957     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.387     Document Type: Article

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