메뉴 건너뛰기




Volumn 74, Issue 10, 2006, Pages 873-879

Measuring Boltzmann's constant with a low-cost atomic force microscope: An undergraduate experiment

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33749575354     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.2335475     Document Type: Article
Times cited : (21)

References (18)
  • 1
    • 10144231975 scopus 로고
    • A new course: The physical principles of biological instrumentation
    • R. S. Newrock, "A new course: The physical principles of biological instrumentation," Am. J. Phys. 46(1), 32-34 (1978).
    • (1978) Am. J. Phys. , vol.46 , Issue.1 , pp. 32-34
    • Newrock, R.S.1
  • 3
    • 0001520372 scopus 로고    scopus 로고
    • Interdigital cantilevers for atomic force microscopy
    • S. R. Manalis, S. C. Minne, A. Atalar, and C. F. Quate, "Interdigital cantilevers for atomic force microscopy," Appl. Phys. Lett. 69(25), 3944-3946 (1996).
    • (1996) Appl. Phys. Lett. , vol.69 , Issue.25 , pp. 3944-3946
    • Manalis, S.R.1    Minne, S.C.2    Atalar, A.3    Quate, C.F.4
  • 5
    • 0000455920 scopus 로고    scopus 로고
    • Analysis and design of an interdigital cantilever as a displacement sensor
    • G. G. Yaralioglu, A. Atalar, S. R. Manalis, and C. F. Quate, "Analysis and design of an interdigital cantilever as a displacement sensor," J. Appl. Phys. 83(12), 7405-7415 (1998).
    • (1998) J. Appl. Phys. , vol.83 , Issue.12 , pp. 7405-7415
    • Yaralioglu, G.G.1    Atalar, A.2    Manalis, S.R.3    Quate, C.F.4
  • 7
    • 33749582359 scopus 로고    scopus 로고
    • note
    • 3/(3EI).
  • 8
    • 33749551363 scopus 로고    scopus 로고
    • See
    • See 〈http://web.mit.edu/be/teachAFM/〉
  • 9
    • 77952760920 scopus 로고
    • Microfabrication of cantilever styli for the atomic force microscope
    • T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate, "Microfabrication of cantilever styli for the atomic force microscope," J. Vac. Sci. Technol. A 8(4), 3386-3396 (1990).
    • (1990) J. Vac. Sci. Technol. A , vol.8 , Issue.4 , pp. 3386-3396
    • Albrecht, T.R.1    Akamine, S.2    Carver, T.E.3    Quate, C.F.4
  • 10
    • 33749562959 scopus 로고    scopus 로고
    • 〈http://www.nnin.org/nnin_site.html〉
  • 11
    • 0008494867 scopus 로고    scopus 로고
    • see (Prentice Hall, Englewood Cliffs), 2nd ed., Chap. 3
    • For simplicity, we omit the intermediate parameter γ that is typically used. For an introductory treatment of harmonic oscillators, see Atam P. Arya, Introduction to Classical Mechanics (Prentice Hall, Englewood Cliffs, 1998), 2nd ed., Chap. 3
    • (1998) Introduction to Classical Mechanics
    • Arya, A.P.1
  • 13
    • 0027540056 scopus 로고
    • A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
    • J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, "A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy," Rev. Sci. Instrum. 64(2), 403-405 (1993).
    • (1993) Rev. Sci. Instrum. , vol.64 , Issue.2 , pp. 403-405
    • Cleveland, J.P.1    Manne, S.2    Bocek, D.3    Hansma, P.K.4
  • 14
    • 0001026801 scopus 로고    scopus 로고
    • A method for determining the spring constant of cantilevers for atomic force microscopy
    • A. Torii, M. Sasaki, K. Hane, and S. Okuma, "A method for determining the spring constant of cantilevers for atomic force microscopy," Meas. Sci. Technol. 7(2), 179-184 (1996).
    • (1996) Meas. Sci. Technol. , vol.7 , Issue.2 , pp. 179-184
    • Torii, A.1    Sasaki, M.2    Hane, K.3    Okuma, S.4
  • 15
    • 0001155528 scopus 로고    scopus 로고
    • Calibration of rectangular atomic force microscope cantilevers
    • J. E. Sader, J. W. M. Chon, and P. Mulvaney, "Calibration of rectangular atomic force microscope cantilevers," Rev. Sci. Instrum. 70(10), 3967-3969 (1999).
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.10 , pp. 3967-3969
    • Sader, J.E.1    Chon, J.W.M.2    Mulvaney, P.3
  • 16
    • 0027578572 scopus 로고
    • Deformation and height anomaly of soft surfaces studied with an AFM
    • A. L. Weisenhorn, M. Khorsandi, S. Kasas, V. Gotzos, and H.-J. Butt, "Deformation and height anomaly of soft surfaces studied with an AFM," Nanotechnology 4(2), 106-113 (1993).
    • (1993) Nanotechnology , vol.4 , Issue.2 , pp. 106-113
    • Weisenhorn, A.L.1    Khorsandi, M.2    Kasas, S.3    Gotzos, V.4    Butt, H.-J.5
  • 17
    • 0037783430 scopus 로고    scopus 로고
    • Nanoscale mapping of the elasticity of microbial cells by atomic force microscopy
    • A. Touhami, B. Nysten, and Y. F. Dufrêne, "Nanoscale mapping of the elasticity of microbial cells by atomic force microscopy," Langmuir 19(11), 4539-4543 (2003).
    • (2003) Langmuir , vol.19 , Issue.11 , pp. 4539-4543
    • Touhami, A.1    Nysten, B.2    Dufrêne, Y.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.