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Volumn 107, Issue 10, 2010, Pages

A mathematical model of the modified Paschen's curve for breakdown in microscale gaps

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC AIR; BREAKDOWN CURVES; BREAKDOWN PHENOMENA; BREAKDOWN VOLTAGE; ELECTRON FIELD EMISSION; ENHANCED FIELD EMISSION; FIELD EMISSION EFFECTS; MATHEMATICAL DESCRIPTIONS; MICRO-SCALES; SMALL GAPS; TRANSITION REGIONS;

EID: 77952989820     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3380855     Document Type: Article
Times cited : (216)

References (54)
  • 1
    • 84944488209 scopus 로고
    • ANPYA2 0003-3804. 10.1002/and18892730505
    • F. Paschen, Ann. Phys. ANPYA2 0003-3804 273, 69 (1889). 10.1002/andp.18892730505
    • (1889) Ann. Phys. , vol.273 , pp. 69
    • Paschen, F.1
  • 5
    • 36849129521 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1700078
    • L. H. Germer, J. Appl. Phys. JAPIAU 0021-8979 22, 955 (1951). 10.1063/1.1700078
    • (1951) J. Appl. Phys. , vol.22 , pp. 955
    • Germer, L.H.1
  • 6
    • 36849135289 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1700121
    • L. H. Germer, J. Appl. Phys. JAPIAU 0021-8979 22, 1133 (1951). 10.1063/1.1700121
    • (1951) J. Appl. Phys. , vol.22 , pp. 1133
    • Germer, L.H.1
  • 7
    • 36849116411 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1702250
    • L. H. Germer and J. L. Smith, J. Appl. Phys. JAPIAU 0021-8979 23, 553 (1952). 10.1063/1.1702250
    • (1952) J. Appl. Phys. , vol.23 , pp. 553
    • Germer, L.H.1    Smith, J.L.2
  • 8
    • 33748640842 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1721634
    • L. H. Germer, J. Appl. Phys. JAPIAU 0021-8979 25, 332 (1954). 10.1063/1.1721634
    • (1954) J. Appl. Phys. , vol.25 , pp. 332
    • Germer, L.H.1
  • 9
    • 0003098976 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1721765
    • P. Kisliuk, J. Appl. Phys. JAPIAU 0021-8979 25, 897 (1954). 10.1063/1.1721765
    • (1954) J. Appl. Phys. , vol.25 , pp. 897
    • Kisliuk, P.1
  • 10
    • 36849130048 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1722042
    • W. S. Boyle and L. H. Germer, J. Appl. Phys. JAPIAU 0021-8979 26, 571 (1955). 10.1063/1.1722042
    • (1955) J. Appl. Phys. , vol.26 , pp. 571
    • Boyle, W.S.1    Germer, L.H.2
  • 11
    • 0040663446 scopus 로고
    • PRVAAH 0096-8250. 10.1103/PhysRev.97.255
    • W. S. Boyle and P. Kisliuk, Phys. Rev. PRVAAH 0096-8250 97, 255 (1955). 10.1103/PhysRev.97.255
    • (1955) Phys. Rev. , vol.97 , pp. 255
    • Boyle, W.S.1    Kisliuk, P.2
  • 13
    • 0001841463 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1734973
    • L. H. Germer, J. Appl. Phys. JAPIAU 0021-8979 30, 46 (1959). 10.1063/1.1734973
    • (1959) J. Appl. Phys. , vol.30 , pp. 46
    • Germer, L.H.1
  • 14
    • 0042199655 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1734974
    • P. Kisliuk, J. Appl. Phys. JAPIAU 0021-8979 30, 51 (1959). 10.1063/1.1734974
    • (1959) J. Appl. Phys. , vol.30 , pp. 51
    • Kisliuk, P.1
  • 15
    • 1242320776 scopus 로고
    • IBMJAE 0018-8646. 10.1147/rd.62.0192
    • R. M. Schaffert, IBM J. Res. Dev. IBMJAE 0018-8646 6, 192 (1962). 10.1147/rd.62.0192
    • (1962) IBM J. Res. Dev. , vol.6 , pp. 192
    • Schaffert, R.M.1
  • 17
    • 0032668304 scopus 로고    scopus 로고
    • NNOTER 0957-4484. 10.1088/0957-4484/10/1/020
    • J. -M. Torres and R. S. Dhariwal, Nanotechnology NNOTER 0957-4484 10, 102 (1999). 10.1088/0957-4484/10/1/020
    • (1999) Nanotechnology , vol.10 , pp. 102
    • Torres, J.-M.1    Dhariwal, R.S.2
  • 19
    • 0034275514 scopus 로고    scopus 로고
    • JMMIEZ 0960-1317. 10.1088/0960-1317/10/3/321
    • T. Ono, D. Y. Sim, and M. Esashi, J. Micromech. Microeng. JMMIEZ 0960-1317 10, 445 (2000). 10.1088/0960-1317/10/3/321
    • (2000) J. Micromech. Microeng. , vol.10 , pp. 445
    • Ono, T.1    Sim, D.Y.2    Esashi, M.3
  • 21
    • 0035874099 scopus 로고    scopus 로고
    • Application of microscale plasma to material processing
    • DOI 10.1016/S0040-6090(00)01670-9, PII S0040609000016709
    • T. Ito, T. Izaki, and K. Terashima, Thin Solid Films THSFAP 0040-6090 386, 300 (2001). 10.1016/S0040-6090(00)01670-9 (Pubitemid 32271736)
    • (2001) Thin Solid Films , vol.386 , Issue.2 , pp. 300-304
    • Ito, T.1    Izaki, T.2    Terashima, K.3
  • 23
    • 0038735374 scopus 로고    scopus 로고
    • PSISDG 0277-786X. 10.1117/12.478191
    • A. Wallash and L. Levit, Proc. SPIE PSISDG 0277-786X 4980, 87 (2003). 10.1117/12.478191
    • (2003) Proc. SPIE , vol.4980 , pp. 87
    • Wallash, A.1    Levit, L.2
  • 24
    • 33745077359 scopus 로고    scopus 로고
    • Electrical breakdown phenomena for devices with micron separations
    • DOI 10.1088/0960-1317/16/7/034, PII S0960131706200998, 034
    • C. -H. Chen, J. A. Yeh, and P. -J. Wang, J. Micromech. Microeng. JMMIEZ 0960-1317 16, 1366 (2006). 10.1088/0960-1317/16/7/034 (Pubitemid 43884517)
    • (2006) Journal of Micromechanics and Microengineering , vol.16 , Issue.7 , pp. 1366-1373
    • Chen, C.-H.1    Yeh, J.A.2    Wang, P.-J.3
  • 32
    • 33846041611 scopus 로고    scopus 로고
    • Electrical breakdown in the microscale: Testing the standard theory
    • DOI 10.1063/1.2400103
    • E. Hourdakis, G. W. Bryant, and N. M. Zimmerman, J. Appl. Phys. JAPIAU 0021-8979 100, 123306 (2006). 10.1063/1.2400103 (Pubitemid 46058143)
    • (2006) Journal of Applied Physics , vol.100 , Issue.12 , pp. 123306
    • Hourdakis, E.1    Bryant, G.W.2    Zimmerman, N.M.3
  • 34
    • 33745910871 scopus 로고    scopus 로고
    • Titanium nitride electrodes for micro-gap discharge
    • DOI 10.1016/j.mejo.2006.03.003, PII S0026269206000516
    • C. -F. Hsieh and S. Jou, Microelectron. J. MICEB9 0026-2692 37, 867 (2006). 10.1016/j.mejo.2006.03.003 (Pubitemid 44041495)
    • (2006) Microelectronics Journal , vol.37 , Issue.9 , pp. 867-870
    • Hsieh, C.-F.1    Jou, S.2
  • 36
    • 19144364644 scopus 로고    scopus 로고
    • Simulation of ion generation and breakdown in atmospheric air
    • DOI 10.1063/1.1806264
    • W. Zhang, T. S. Fisher, and S. V. Garimella, J. Appl. Phys. JAPIAU 0021-8979 96, 6066 (2004). 10.1063/1.1806264 (Pubitemid 40715244)
    • (2004) Journal of Applied Physics , vol.96 , Issue.11 , pp. 6066-6072
    • Zhang, W.1    Fisher, T.S.2    Garimella, S.V.3
  • 38
    • 35348854388 scopus 로고    scopus 로고
    • A particle-in-cell simulation of the high-field effect in devices with micrometer gaps
    • DOI 10.1109/TPS.2007.906125, Special Issue on Modeling and Simulation of Collisional Low-Temperature Plasmas
    • M. Radmilović-Radjenović and B. Radjenović, IEEE Trans. Plasma Sci. ITPSBD 0093-3813 35, 1223 (2007). 10.1109/TPS.2007.906125 (Pubitemid 47591281)
    • (2007) IEEE Transactions on Plasma Science , vol.35 , Issue.5 , pp. 1223-1228
    • Radmilovic-Radjenovic, M.1    Radjenovic, B.2
  • 39
    • 34247493291 scopus 로고    scopus 로고
    • The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps
    • DOI 10.1088/0963-0252/16/2/017, PII S0963025207202749, 017
    • M. Radmilović-Radjenović and B. Radjenović, Plasma Sources Sci. Technol. PSTEEU 0963-0252 16, 337 (2007). 10.1088/0963-0252/16/2/ 017 (Pubitemid 46646755)
    • (2007) Plasma Sources Science and Technology , vol.16 , Issue.2 , pp. 337-340
    • Radmilovic-Radjenovic, M.1    Radjenovic, B.2
  • 40
    • 43149101825 scopus 로고    scopus 로고
    • Theoretical study of the electron field emission phenomena in the generation of a micrometer scale discharge
    • DOI 10.1088/0963-0252/17/2/024005, PII S0963025208613730
    • M. Radmilović-Radjenović and B. Radjenović, Plasma Sources Sci. Technol. PSTEEU 0963-0252 17, 024005 (2008). 10.1088/0963-0252/17/ 2/024005 (Pubitemid 351643327)
    • (2008) Plasma Sources Science and Technology , vol.17 , Issue.2 , pp. 024005
    • Radmilovic-Radjenovic, M.1    Radjenovic, B.2
  • 41
    • 79051471404 scopus 로고    scopus 로고
    • EULEEJ 0295-5075. 10.1209/0295-5075/83/25001
    • M. Radmilović-Radjenović and B. Radjenović, EPL EULEEJ 0295-5075 83, 25001 (2008). 10.1209/0295-5075/83/25001
    • (2008) EPL , vol.83 , pp. 25001
    • Radmilović-Radjenović, M.1    Radjenović, B.2
  • 44
    • 11344283803 scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.1735372
    • G. Ecker and K. G. Müller, J. Appl. Phys. JAPIAU 0021-8979 30, 1466 (1959). 10.1063/1.1735372
    • (1959) J. Appl. Phys. , vol.30 , pp. 1466
    • Ecker, G.1    Müller, K.G.2
  • 45
    • 0030110357 scopus 로고    scopus 로고
    • JPAPBE 0022-3727. 10.1088/0022-3727/29/3/031
    • P. Test́ and J. -P. Chabrerie, J. Phys. D JPAPBE 0022-3727 29, 697 (1996). 10.1088/0022-3727/29/3/031
    • (1996) J. Phys. D , vol.29 , pp. 697
    • Test́, P.1    Chabrerie, J.-P.2
  • 46
    • 0030394323 scopus 로고    scopus 로고
    • JPAPBE 0022-3727. 10.1088/0022-3727/29/12/019
    • R. Gayet, C. Harel, T. Josso, and H. Jouin, J. Phys. D JPAPBE 0022-3727 29, 3063 (1996). 10.1088/0022-3727/29/12/019
    • (1996) J. Phys. D , vol.29 , pp. 3063
    • Gayet, R.1    Harel, C.2    Josso, T.3    Jouin, H.4
  • 48
    • 0032048003 scopus 로고    scopus 로고
    • JPAPBE 0022-3727. 10.1088/0022-3727/31/8/011
    • T. Josso, H. Jouin, C. Harel, and R. Gayet, J. Phys. D JPAPBE 0022-3727 31, 996 (1998). 10.1088/0022-3727/31/8/011
    • (1998) J. Phys. D , vol.31 , pp. 996
    • Josso, T.1    Jouin, H.2    Harel, C.3    Gayet, R.4
  • 53
    • 0002917356 scopus 로고
    • PRVAAH 0096-8250. 10.1103/PhysRev.125.67
    • R. Stratton, Phys. Rev. PRVAAH 0096-8250 125, 67 (1962). 10.1103/PhysRev.125.67
    • (1962) Phys. Rev. , vol.125 , pp. 67
    • Stratton, R.1
  • 54
    • 0003998388 scopus 로고
    • CRC, 68th ed., edited by R. Weast (CRC, Cleveland).
    • CRC, Handbook of Chemistry and Physics, 68th ed., edited by, R. Weast, (CRC, Cleveland, 1987).
    • (1987) Handbook of Chemistry and Physics


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