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Volumn 146, Issue 3, 2004, Pages 279-282
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Structure-performance relationship in pentacene/Al2O3 thin-film transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COMPOUNDS;
CONCENTRATION (PROCESS);
DISLOCATIONS (CRYSTALS);
ELECTRIC POTENTIAL;
GRAIN BOUNDARIES;
HOLE MOBILITY;
SURFACE PROPERTIES;
SURFACE TREATMENT;
X RAY DIFFRACTION;
FILM DEPOSITION;
SEMICONDUCTOR INTERFACE;
VACUUM DEPOSITION;
VOLTAGE DEPENDENCE;
THIN FILM TRANSISTORS;
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EID: 9344230404
PISSN: 03796779
EISSN: None
Source Type: Journal
DOI: 10.1016/j.synthmet.2004.08.018 Document Type: Conference Paper |
Times cited : (64)
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References (15)
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