SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 81, Issue 3, 2010, Pages

Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection

(5) Hub, C a Wenzel, S a Raabe, J b Ade, H c Fink, R H a

a UNIVERSITY OF ERLANGEN NUREMBERG (Germany)

b PAUL SCHERRER INSTITUTE (Switzerland)

c NORTH CAROLINA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACK ILLUMINATION; BULK SENSITIVITY; CHANNELTRON; ELECTRON DETECTION; EXPERIMENTAL SETUP; HIGH-LATERAL RESOLUTION; MICRO SPECTROSCOPY; RESONANT EXCITATION; SECONDARY ELECTRON DETECTION; SECONDARY ELECTRONS; SURFACE SENSITIVITY; SWISS LIGHT SOURCES; X-RAY DETECTIONS;

ELECTRONS; LIGHT SOURCES; LIGHT TRANSMISSION; SECONDARY EMISSION;

ELECTRON MULTIPLIERS;

EID: 77950549463 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3360813 Document Type: Article

Times cited : (28)

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