-
1
-
-
54249118705
-
-
SCIEAS 0036-8075. 10.1126/science.1160601
-
Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, and O. Custance, Science SCIEAS 0036-8075 322, 17 (2008). 10.1126/science.1160601
-
(2008)
Science
, vol.322
, pp. 17
-
-
Sugimoto, Y.1
Pou, P.2
Abe, M.3
Jelinek, P.4
Perez, R.5
Morita, S.6
Custance, O.7
-
3
-
-
0037187237
-
Dynamic force microscopy using FM detection in various environments
-
DOI 10.1016/S0169-4332(01)00971-0, PII S0169433201009710
-
K. Kobayashi, H. Yamada, and K. Matsushige, Appl. Surf. Sci. ASUSEE 0169-4332 188, 430 (2002). 10.1016/S0169-4332(01)00971-0 (Pubitemid 34551767)
-
(2002)
Applied Surface Science
, vol.188
, Issue.3-4
, pp. 430-434
-
-
Kobayashi, K.1
Yamada, H.2
Matsushige, K.3
-
4
-
-
67649379099
-
-
NNOTER 0957-4484. 10.1088/0957-4484/20/26/264008
-
Hitoshi Asakawa and Takeshi Fukuma, Nanotechnology NNOTER 0957-4484 20, 264008 (2009). 10.1088/0957-4484/20/26/264008
-
(2009)
Nanotechnology
, vol.20
, pp. 264008
-
-
Asakawa, H.1
Fukuma, T.2
-
5
-
-
18544366562
-
A differential microcantilever-based system for measuring surface stress changes induced by electrochemical reactions
-
DOI 10.1016/j.snb.2004.10.007, PII S0925400504007002
-
V. Tabard-Cossa, M. Godin, L. Y. Beaulieu, and P. Grütter, Sens. Actuators B SABCEB 0925-4005 107, 233 (2005). 10.1016/j.snb.2004.10.007 (Pubitemid 40655076)
-
(2005)
Sensors and Actuators, B: Chemical
, vol.107
, Issue.1 SPEC. ISS.
, pp. 233-241
-
-
Tabard-Cossa, V.1
Godin, M.2
Beaulieu, L.Y.3
Grutter, P.4
-
6
-
-
0347653361
-
Theories of scanning probe microscopes at the atomic scale
-
DOI 10.1103/RevModPhys.75.1287
-
W. A. Hofer, A. S. Foster, and A. L. Shluger, Rev. Mod. Phys. RMPHAT 0034-6861 75, 1287 (2003). 10.1103/RevModPhys.75.1287 (Pubitemid 38037751)
-
(2003)
Reviews of Modern Physics
, vol.75
, Issue.4
, pp. 1287-1331
-
-
Hofer, W.A.1
Foster, A.S.2
Shluger, A.L.3
-
7
-
-
33748988154
-
Single-atom contact mechanics: From atomic scale energy barrier to mechanical relaxation hysteresis
-
DOI 10.1103/PhysRevLett.97.136101
-
A. Schirmeisen, D. Weiner, and H. Fuchs, Phys. Rev. Lett. PRLTAO 0031-9007 97, 136101 (2006). 10.1103/PhysRevLett.97.136101 (Pubitemid 44455048)
-
(2006)
Physical Review Letters
, vol.97
, Issue.13
, pp. 136101
-
-
Schirmeisen, A.1
Weiner, D.2
Fuchs, H.3
-
9
-
-
51349168227
-
-
PRBMDO 0163-1829. 10.1103/PhysRevB.78.113401
-
G. H. Simon, T. König, M. Nilius, H.-P. Rust, M. Heyde, and H.-J. Freund, Phys. Rev. B PRBMDO 0163-1829 78, 113401 (2008). 10.1103/PhysRevB.78. 113401
-
(2008)
Phys. Rev. B
, vol.78
, pp. 113401
-
-
Simon, G.H.1
König, T.2
Nilius, M.3
Rust, H.-P.4
Heyde, M.5
Freund, H.-J.6
-
10
-
-
67649337025
-
-
NNOTER 0957-4484. 10.1088/0957-4484/20/26/264009
-
A Bettac, J. Koeble, K. Winkler, B. Uder, M. Maier, and A. Feltz, Nanotechnology NNOTER 0957-4484 20, 264009 (2009). 10.1088/0957-4484/20/26/ 264009
-
(2009)
Nanotechnology
, vol.20
, pp. 264009
-
-
Bettac, A.1
Koeble, J.2
Winkler, K.3
Uder, B.4
Maier, M.5
Feltz, A.6
-
11
-
-
34547426386
-
2(110)
-
DOI 10.1021/jp0701789
-
C. L. Pang, A. Sasahara, and H. Onishi, J. Phys. Chem. C JPCCCK 1932-7447 111, 9221 (2007). 10.1021/jp0701789 (Pubitemid 47166861)
-
(2007)
Journal of Physical Chemistry C
, vol.111
, Issue.26
, pp. 9221-9226
-
-
Pang, C.L.1
Sasahara, A.2
Onishii, H.3
-
12
-
-
62749200523
-
-
JPCCCK 1932-7447. 10.1021/jp8095677
-
R. Bechstein, M. Kitta, J. Schütte, A. Kühnle, and H. Onishi, J. Phys. Chem. C JPCCCK 1932-7447 113, 3277 (2009). 10.1021/jp8095677
-
(2009)
J. Phys. Chem. C
, vol.113
, pp. 3277
-
-
Bechstein, R.1
Kitta, M.2
Schütte, J.3
Kühnle, A.4
Onishi, H.5
-
14
-
-
67049158292
-
-
NNAABX 1748-3387. 10.1038/nnano.2009.57
-
B. J. Albers, T. C. Schwendemann, M. Z. Baykara, N. Pilet, M. Liebmann, E. I. Altman, and U. D. Schwarz, Nat. Nanotechnol. NNAABX 1748-3387 4, 307 (2009). 10.1038/nnano.2009.57
-
(2009)
Nat. Nanotechnol.
, vol.4
, pp. 307
-
-
Albers, B.J.1
Schwendemann, T.C.2
Baykara, M.Z.3
Pilet, N.4
Liebmann, M.5
Altman, E.I.6
Schwarz, U.D.7
-
15
-
-
41549134752
-
Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy
-
DOI 10.1063/1.2842631
-
B. J. Albers, M. Liebmann, T. C. Schwendemann, M. Z. Baykara, M. Heyde, M. Salmeron, E. I. Altman, and U. D. Schwarz, Rev. Sci. Instrum. RSINAK 0034-6748 79, 033704 (2008). 10.1063/1.2842631 (Pubitemid 351469755)
-
(2008)
Review of Scientific Instruments
, vol.79
, Issue.3
, pp. 033704
-
-
Albers, B.J.1
Liebmann, M.2
Schwendemann, T.C.3
Baykara, M.Z.4
Heyde, M.5
Salmeron, M.6
Altman, E.I.7
Schwarz, U.D.8
-
16
-
-
33745769316
-
Identification of nanoscale dissipation processes by dynamic atomic force microscopy
-
DOI 10.1103/PhysRevLett.97.016103
-
R. Garcia, C. J. Gomez, N. F. Martinez, S. Patil, C. Dietz, and R. Magerle, Phys. Rev. Lett. PRLTAO 0031-9007 97, 016103 (2006). 10.1103/PhysRevLett.97.016103 (Pubitemid 44024545)
-
(2006)
Physical Review Letters
, vol.97
, Issue.1
, pp. 016103
-
-
Garcia, R.1
Gomez, C.J.2
Martinez, N.F.3
Patil, S.4
Dietz, C.5
Magerle, R.6
-
17
-
-
79957996199
-
-
in, edited by Bekir Akta, Faik Mikailov, and Lenar Tagirov (Springer-Verlag, Berlin). 10.1007/978-3-540-49336-5-2
-
A. Oral, in Magnetic Nanostructures, edited by, Bekir Akta, Faik Mikailov, and, Lenar Tagirov, (Springer-Verlag, Berlin, 2007), Vol. 94, pp. 7-14. 10.1007/978-3-540-49336-5-2
-
(2007)
Magnetic Nanostructures
, vol.94
, pp. 7-14
-
-
Oral, A.1
-
18
-
-
37749033673
-
-
PRBMDO 0163-1829. 10.1103/PhysRevB.77.045402
-
M. Schmid, J. Mannhart, and F. J. Giessibl, Phys. Rev. B PRBMDO 0163-1829 77, 045402 (2008). 10.1103/PhysRevB.77.045402
-
(2008)
Phys. Rev. B
, vol.77
, pp. 045402
-
-
Schmid, M.1
Mannhart, J.2
Giessibl, F.J.3
-
20
-
-
67649363938
-
-
NNOTER 0957-4484. 10.1088/0957-4484/20/26/264007
-
R. Schmidt, A. Schwarz, and R. Wiesendanger, Nanotechnology NNOTER 0957-4484 20, 264007 (2009). 10.1088/0957-4484/20/26/264007
-
(2009)
Nanotechnology
, vol.20
, pp. 264007
-
-
Schmidt, R.1
Schwarz, A.2
Wiesendanger, R.3
-
21
-
-
44449114744
-
-
PRBMDO 0163-1829. 10.1103/PhysRevB.77.205435
-
M. Harada and M. Tsukada, Phys. Rev. B PRBMDO 0163-1829 77, 205435 (2008). 10.1103/PhysRevB.77.205435
-
(2008)
Phys. Rev. B
, vol.77
, pp. 205435
-
-
Harada, M.1
Tsukada, M.2
-
22
-
-
77952963044
-
-
in, edited by M. Iwamoto, K. Kaneto, and S. Mashiko (Elsevier, New York), Cha, 10.1016/B978-044451091-4/50022-4
-
S. Morita and Y. Sugawara, in Nanotechnology and Nano-Interface Controlled Electronic Devices, edited by, M. Iwamoto, K. Kaneto, and, S. Mashiko, (Elsevier, New York, 2003), Chap. pp. 429-453. 10.1016/B978-044451091- 4/50022-4
-
(2003)
Nanotechnology and Nano-Interface Controlled Electronic Devices
, pp. 429-453
-
-
Morita, S.1
Sugawara, Y.2
-
23
-
-
39749147651
-
The force needed to move an atom on a surface
-
DOI 10.1126/science.1150288
-
M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl, and A. J. Heinrich, Science SCIEAS 0036-8075 319, 1066 (2008). 10.1126/science.1150288 (Pubitemid 351300783)
-
(2008)
Science
, vol.319
, Issue.5866
, pp. 1066-1069
-
-
Ternes, M.1
Lutz, C.P.2
Hirjibehedin, C.F.3
Giessibl, F.J.4
Heinrich, A.J.5
-
24
-
-
33748263379
-
Influence of the local adsorption environment on the intramolecular contrast of organic molecules in noncontact atomic force microscopy
-
DOI 10.1063/1.2345235
-
B. Such, A. Schirmeisen, D. Weiner, and H. Fuchs, Appl. Phys. Lett. APPLAB 0003-6951 89, 093104 (2006). 10.1063/1.2345235 (Pubitemid 44319977)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.9
, pp. 093104
-
-
Such, B.1
Weiner, D.2
Schirmeisen, A.3
Fuchs, H.4
-
25
-
-
55149109465
-
-
JJAPA5 0021-4922. 10.1143/JJAP.47.6125
-
Y. Hosokawa, T. Ichii, K. Kobayashi, K. Matsushige, and H. Yamada, Jpn. J. Appl. Phys. JJAPA5 0021-4922 47, 6125 (2008). 10.1143/JJAP.47.6125
-
(2008)
Jpn. J. Appl. Phys.
, vol.47
, pp. 6125
-
-
Hosokawa, Y.1
Ichii, T.2
Kobayashi, K.3
Matsushige, K.4
Yamada, H.5
-
27
-
-
0033892144
-
Quality factors in micron- and submicron-thick cantilevers
-
DOI 10.1109/84.825786
-
K. Y. Yasumura, T. D. Stowe, E. M. Chow, T. Pfafman, T. W. Kenny, B. C. Stipe, and D. Rugar, J. Microelectromech. Syst. JMIYET 1057-7157 9, 117 (2000). 10.1109/84.825786 (Pubitemid 30581703)
-
(2000)
Journal of Microelectromechanical Systems
, vol.9
, Issue.1
, pp. 117-125
-
-
Yasumura, K.Y.1
Stowe, T.D.2
Chow, E.M.3
Pfafman, T.4
Kenny, T.W.5
Stipe, B.C.6
Rugar, D.7
-
28
-
-
33847294291
-
-
10.1109/ICSENS.2005.1597710
-
W. Zhang and K. L. Turner, Sensors IEEE 2005, 4 (2005). 10.1109/ICSENS.2005.1597710
-
(2005)
Sensors IEEE
, vol.2005
, pp. 4
-
-
Zhang, W.1
Turner, K.L.2
-
29
-
-
66749118842
-
-
APPLAB 0003-6951. 10.1063/1.3149700
-
H. Hölscher, P. Milde, U. Zerweck, L. M. Eng, and R. Hoffmann, Appl. Phys. Lett. APPLAB 0003-6951 94, 223514 (2009). 10.1063/1.3149700
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 223514
-
-
Hölscher, H.1
Milde, P.2
Zerweck, U.3
Eng, L.M.4
Hoffmann, R.5
-
31
-
-
54549085718
-
-
MSRMDA 0263-2241. 10.1016/j.measurement.2008.03.007
-
A. M. Schilowitz, D. G. Yablon, E. Lansey, and F. R. Zypman, Measurement MSRMDA 0263-2241 41, 1169 (2008). 10.1016/j.measurement.2008.03.007
-
(2008)
Measurement
, vol.41
, pp. 1169
-
-
Schilowitz, A.M.1
Yablon, D.G.2
Lansey, E.3
Zypman, F.R.4
-
33
-
-
0037581604
-
-
RSINAK 0034-6748. 10.1063/1.1150690
-
S. Rast, C. Wattinger, U. Gysin, and E. Meyer, Rev. Sci. Instrum. RSINAK 0034-6748 71, 2772 (2000). 10.1063/1.1150690
-
(2000)
Rev. Sci. Instrum.
, vol.71
, pp. 2772
-
-
Rast, S.1
Wattinger, C.2
Gysin, U.3
Meyer, E.4
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