The effective quality factor at low temperatures in dynamic force microscopes with Fabry-Ṕrot interferometer detection

Applied Physics Letters

Volumn 94, Issue 22, 2009, Pages

  Hölscher, Hendrik ^a   Milde, Peter ^b   Zerweck, Ulrich ^b   Eng, Lukas M ^b   Hoffmann, Regina ^c  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b Institut fuer Angewandte Photophysik   (Germany)

^c UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC FORCE MICROSCOPES; DYNAMIC FORCE MICROSCOPY; LASER POWER; LOW TEMPERATURES; PHOTO-INDUCED; QUALITY FACTORS; RESONANCE CURVES; SILICON CANTILEVER;

ATOMIC FORCE MICROSCOPY; INTERFEROMETERS; INTERFEROMETRY; Q FACTOR MEASUREMENT; VACUUM;

NANOCANTILEVERS;

EID: 66749118842     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3149700     Document Type: Article

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