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Volumn 106, Issue 4, 2009, Pages

Analysis of size effects in Pb (Zr0.54 Ti0.46) O 3 thin film capacitors with platinum and LaNiO3 conducting oxide electrodes

(4) Bouregba, R a Sama, N b Soyer, C b Remiens, D b

a UNIVERSITÉ DE CAEN (France)

b INSTITUT D ELECTRONIQUE (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEFECTS; COERCIVE FIELD; CONDUCTING OXIDE ELECTRODES; CONDUCTING OXIDES; DEPOLARIZATION FIELDS; DIELECTRIC AND FERROELECTRIC PROPERTIES; DIELECTRIC PERMITTIVITIES; ELECTRODE CONFIGURATIONS; EXPERIMENTAL DATA; INTERFACE CHEMISTRY; LITERATURE DATA; PZT; REMNANT POLARIZATIONS; SCREENING LENGTHS; SIZE EFFECTS; THICKNESS DEPENDENCE; THIN-FILM CAPACITORS; UPPER SURFACE;

CAPACITANCE; CAPACITORS; ELECTROCHEMICAL ELECTRODES; LEAD; LEAD ALLOYS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PLATINUM; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; THIN FILM CIRCUITS; THIN FILM DEVICES; THIN FILMS; ZIRCONIUM;

ELECTROLYTIC CAPACITORS;

EID: 69749110092 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3200956 Document Type: Article

Times cited : (21)

References (38)

1
- 0003527147
- (Springer, New York).
- J. F. Scott, Ferroelectric Memories (Springer, New York, 2000).
- (2000) Ferroelectric Memories
- Scott, J.F.¹

2
- 36849130271
- 0021-8979,. 10.1063/1.1722518
- W. J. Merz, J. Appl. Phys. 0021-8979 27, 938 (1956). 10.1063/1.1722518
- (1956) J. Appl. Phys. , vol.27 , pp. 938
- Merz, W.J.¹

3
- 84948872750
- 1478-6435,. 10.1080/14786436208214471
- H. F. Kay and J. W. Dunn, Philos. Mag. 1478-6435 7, 2027 (1962). 10.1080/14786436208214471
- (1962) Philos. Mag. , vol.7 , pp. 2027
- Kay, H.F.¹ Dunn, J.W.²

4
- 0000710324
- 0021-8979,. 10.1063/1.353936
- Y. Sakashita, H. Segawa, K. Tominaga, and M. Okada, J. Appl. Phys. 0021-8979 73, 7857 (1993). 10.1063/1.353936
- (1993) J. Appl. Phys. , vol.73 , pp. 7857
- Sakashita, Y.¹ Segawa, H.² Tominaga, K.³ Okada, M.⁴

5
- 11544356927
- 0021-8979,. 10.1063/1.357589
- P. K. Larsen, G. J. M. Dormans, D. J. Taylor, and P. J. van Veldhoven, J. Appl. Phys. 0021-8979 76, 2405 (1994). 10.1063/1.357589
- (1994) J. Appl. Phys. , vol.76 , pp. 2405
- Larsen, P.K.¹ Dormans, G.J.M.² Taylor, D.J.³ Van Veldhoven, P.J.⁴

6
- 0028381856
- 1058-4587,. 10.1080/10584589408018654
- A. K. Tagantsev, C. Z. Pawlaczyk, K. Brooks, and N. Setter, Integr. Ferroelectr. 1058-4587 4, 1 (1994). 10.1080/10584589408018654
- (1994) Integr. Ferroelectr. , vol.4 , pp. 1
- Tagantsev, A.K.¹ Pawlaczyk, C.Z.² Brooks, K.³ Setter, N.⁴

7
- 0001214947
- 0163-1829,. 10.1103/PhysRevB.54.R14337
- S. B. Ren, C. J. Lu, J. S. Liu, H. M. Shen, and Y. N. Wang, Phys. Rev. B 0163-1829 54, R14337 (1996). 10.1103/PhysRevB.54.R14337
- (1996) Phys. Rev. B , vol.54 , pp. 14337
- Ren, S.B.¹ Lu, C.J.² Liu, J.S.³ Shen, H.M.⁴ Wang, Y.N.⁵

8
- 0000256395
- 0031-9007,. 10.1103/PhysRevLett.84.175
- S. Ducharme, V. M. Fridkin, A. V. Bune, S. P. Palto, L. M. Blinov, N. N. Petukhova, and S. G. Yudin, Phys. Rev. Lett. 0031-9007 84, 175 (2000). 10.1103/PhysRevLett.84.175
- (2000) Phys. Rev. Lett. , vol.84 , pp. 175
- Ducharme, S.¹ Fridkin, V.M.² Bune, A.V.³ Palto, S.P.⁴ Blinov, L.M.⁵ Petukhova, N.N.⁶ Yudin, S.G.⁷

9
- 0242580842
- 0003-6951,. 10.1063/1.1621731
- N. A. Pertsev, J. Rodriguez Contreras, V. G. Kukhar, B. Hermanns, H. Kohlstedt, and R. Waser, Appl. Phys. Lett. 0003-6951 83, 3356 (2003). 10.1063/1.1621731
- (2003) Appl. Phys. Lett. , vol.83 , pp. 3356
- Pertsev, N.A.¹ Rodriguez Contreras, J.² Kukhar, V.G.³ Hermanns, B.⁴ Kohlstedt, H.⁵ Waser, R.⁶

10
- 0027660508
- 0021-4922,. 10.1143/JJAP.32.4061
- T. Hase, T. Sakuma, Y. Miyasaka, K. Hirata, and N. Hosokawa, Jpn. J. Appl. Phys., Part 1 0021-4922 32, 4061 (1993). 10.1143/JJAP.32.4061
- (1993) Jpn. J. Appl. Phys., Part 1 , vol.32 , pp. 4061
- Hase, T.¹ Sakuma, T.² Miyasaka, Y.³ Hirata, K.⁴ Hosokawa, N.⁵

11
- 36449003911
- 0021-8979,. 10.1063/1.359737
- J. J. Lee, C. L. Thio, and S. B. Desu, J. Appl. Phys. 0021-8979 78, 5073 (1995). 10.1063/1.359737
- (1995) J. Appl. Phys. , vol.78 , pp. 5073
- Lee, J.J.¹ Thio, C.L.² Desu, S.B.³

12
- 3142663171
- 0003-6951,. 10.1063/1.1765742
- V. Nagarajan, S. Prasertchoung, T. Zhao, H. Zheng, J. Ouyang, R. Ramesh, W. Tian, X. Q. Pan, D. M. Kim, C. B. Eom, H. Kohlstedt, and R. Waser, Appl. Phys. Lett. 0003-6951 84, 5225 (2004). 10.1063/1.1765742
- (2004) Appl. Phys. Lett. , vol.84 , pp. 5225
- Nagarajan, V.¹ Prasertchoung, S.² Zhao, T.³ Zheng, H.⁴ Ouyang, J.⁵ Ramesh, R.⁶ Tian, W.⁷ Pan, X.Q.⁸ Kim, D.M.⁹ Eom, C.B.¹⁰ Kohlstedt, H.¹¹ Waser, R.¹²

13
- 17944383404
- Critical thickness of ultrathin ferroelectric BaTi O3 films
- DOI 10.1063/1.1880443, 102907
- Y. S. Kim, D. H. Kim, Y. J. Chang, T. W. Noh, J. H. Kong, K. Char, Y. D. Park, S. D. Bu, J. -G. Yoon, and J. -S. Chung, Appl. Phys. Lett. 0003-6951 86, 102907 (2005). 10.1063/1.1880443 (Pubitemid 40597122)
- (2005) Applied Physics Letters , vol.86 , Issue.10 , pp. 1-3
- Kim, Y.S.¹ Kim, D.H.² Kim, J.D.³ Chang, Y.J.⁴ Noh, T.W.⁵ Kong, J.H.⁶ Char, K.⁷ Park, Y.D.⁸ Bu, S.D.⁹ Yoon, J.-G.¹⁰ Chung, J.-S.¹¹

14
- 32944473983
- Ferroelectric properties of SrRu O3 BaTi O3 SrRu O3 ultrathin film capacitors free from passive layers
- DOI 10.1063/1.2174100
- Y. S. Kim, J. Y. Jo, D. J. Kim, Y. J. Chang, J. H. Lee, T. W. Noh, T. K. Song, J. -G. Yoon, J. -S. Chung, S. I. Baik, Y. -W. Kim, and C. U. Jung, Appl. Phys. Lett. 0003-6951 88, 072909 (2006). 10.1063/1.2174100 (Pubitemid 43261839)
- (2006) Applied Physics Letters , vol.88 , Issue.7 , pp. 072909
- Kim, Y.S.¹ Jo, J.Y.² Kim, D.J.³ Chang, Y.J.⁴ Lee, J.H.⁵ Noh, T.W.⁶ Song, T.K.⁷ Yoon, J.-G.⁸ Chung, J.-S.⁹ Baik, S.I.¹⁰ Kim, Y.-W.¹¹ Jung, C.U.¹²

15
- 29844449839
- 0009-0700,. 10.1007/BF01688741
- V. Janovec, Czech. J. Phys., Sect. A 0009-0700 8, 3 (1958). 10.1007/BF01688741
- (1958) Czech. J. Phys., Sect. A , vol.8 , pp. 3
- Janovec, V.¹

16
- 0015368424
- 0038-1098,. 10.1016/0038-1098(72)91180-5
- I. P. Batra and B. D. Silverman, Solid State Commun. 0038-1098 11, 291 (1972). 10.1016/0038-1098(72)91180-5
- (1972) Solid State Commun. , vol.11 , pp. 291
- Batra, I.P.¹ Silverman, B.D.²

17
- 0015656842
- 0021-8979,. 10.1063/1.1662770
- R. R. Mehta, B. D. Silverman, and J. T. Jacobs, J. Appl. Phys. 0021-8979 44, 3379 (1973). 10.1063/1.1662770
- (1973) J. Appl. Phys. , vol.44 , pp. 3379
- Mehta, R.R.¹ Silverman, B.D.² Jacobs, J.T.³

18
- 0016777049
- 0015-0193.
- P. Würfel and I. P. Batra, Ferroelectrics 0015-0193 12, 55 (1976).
- (1976) Ferroelectrics , vol.12 , pp. 55
- Würfel, P.¹ Batra, I.P.²

19
- 0037417284
- Critical thickness for ferroelectricity in perovskite ultrathin films
- DOI 10.1038/nature01501
- J. Junquera and P. Ghosez, Nature (London) 0028-0836 422, 506 (2003). 10.1038/nature01501 (Pubitemid 36433642)
- (2003) Nature , vol.422 , Issue.6931 , pp. 506-509
- Junquera, J.¹ Ghosez, P.²

20
- 0000895449
- 0003-6951,. 10.1063/1.123539
- A. K. Tagantsev and I. A. Stolichnov, Appl. Phys. Lett. 0003-6951 74, 1326 (1999). 10.1063/1.123539
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1326
- Tagantsev, A.K.¹ Stolichnov, I.A.²

21
- 36449005082
- 0021-8979,. 10.1063/1.360122
- A. K. Tagantsev, M. Landivar, E. Colla, and N. Setter, J. Appl. Phys. 0021-8979 78, 2623 (1995). 10.1063/1.360122
- (1995) J. Appl. Phys. , vol.78 , pp. 2623
- Tagantsev, A.K.¹ Landivar, M.² Colla, E.³ Setter, N.⁴

22
- 0031102101
- 0021-8979,. 10.1063/1.363961
- J. F. M. Cillessen, M. W. J. Prins, and R. M. Wolf, J. Appl. Phys. 0021-8979 81, 2777 (1997). 10.1063/1.363961
- (1997) J. Appl. Phys. , vol.81 , pp. 2777
- Cillessen, J.F.M.¹ Prins, M.W.J.² Wolf, R.M.³

23
- 46549086535
- 0022-0248,. 10.1016/j.jcrysgro.2008.04.025
- N. Sama, R. Herdier, D. Jenkins, C. Soyer, D. Remiens, M. Detalle, and R. Bouregba, J. Cryst. Growth 0022-0248 310, 3299 (2008). 10.1016/j.jcrysgro.2008. 04.025
- (2008) J. Cryst. Growth , vol.310 , pp. 3299
- Sama, N.¹ Herdier, R.² Jenkins, D.³ Soyer, C.⁴ Remiens, D.⁵ Detalle, M.⁶ Bouregba, R.⁷

24
- 33746114495
- 0021-8979,. 10.1063/1.346845
- S. L. Miller, R. D. Nasby, J. R. Schwank, M. S. Rodgers, and P. V. Dressendorfer, J. Appl. Phys. 0021-8979 68, 6463 (1990). 10.1063/1.346845
- (1990) J. Appl. Phys. , vol.68 , pp. 6463
- Miller, S.L.¹ Nasby, R.D.² Schwank, J.R.³ Rodgers, M.S.⁴ Dressendorfer, P.V.⁵

25
- 0001788433
- 0015-0193.
- C. J. Brennan, Ferroelectrics 0015-0193 132, 245 (1992).
- (1992) Ferroelectrics , vol.132 , pp. 245
- Brennan, C.J.¹

26
- 33645530912
- 0021-8979,. 10.1063/1.2170414
- R. Bouregba, G. Le Rhun, G. Poullain, and G. Leclerc, J. Appl. Phys. 0021-8979 99, 034102 (2006). 10.1063/1.2170414
- (2006) J. Appl. Phys. , vol.99 , pp. 034102
- Bouregba, R.¹ Le Rhun, G.² Poullain, G.³ Leclerc, G.⁴

27
- 0031375739
- 1058-4587,. 10.1080/10584589708013046
- A. K. Tagantsev, Integr. Ferroelectr. 1058-4587 16, 237 (1997). 10.1080/10584589708013046
- (1997) Integr. Ferroelectr. , vol.16 , pp. 237
- Tagantsev, A.K.¹

28
- 0038574011
- 0953-8984,. 10.1088/0953-8984/15/24/106
- M. Dawber, P. Chandra, P. B. Littlewood, and J. F. Scott, J. Phys.: Condens. Matter 0953-8984 15, L393 (2003). 10.1088/0953-8984/15/24/106
- (2003) J. Phys.: Condens. Matter , vol.15 , pp. 393
- Dawber, M.¹ Chandra, P.² Littlewood, P.B.³ Scott, J.F.⁴

29
- 18744374438
- Size effect and fatigue mechanism in ferroelectric thin films
- DOI 10.1063/1.1506193
- H. Z. Jin and J. Zhu, J. Appl. Phys. 0021-8979 92, 4594 (2002). 10.1063/1.1506193 (Pubitemid 35328336)
- (2002) Journal of Applied Physics , vol.92 , Issue.8 , pp. 4594
- Jin, H.Z.¹ Zhu, J.²

30
- 0001305943
- 0021-8979,. 10.1063/1.1305854
- I. Stolichnov, A. Tagantsev, E. Colla, S. Gentil, S. Hiboux, J. Baborowski, P. Muralt, and N. Setter, J. Appl. Phys. 0021-8979 88, 2154 (2000). 10.1063/1.1305854
- (2000) J. Appl. Phys. , vol.88 , pp. 2154
- Stolichnov, I.¹ Tagantsev, A.² Colla, E.³ Gentil, S.⁴ Hiboux, S.⁵ Baborowski, J.⁶ Muralt, P.⁷ Setter, N.⁸

31
- 7044231700
- 0021-8979,. 10.1063/1.1784612
- G. Le Rhun, G. Poullain, and R. Bouregba, J. Appl. Phys. 0021-8979 96, 3876 (2004). 10.1063/1.1784612
- (2004) J. Appl. Phys. , vol.96 , pp. 3876
- Le Rhun, G.¹ Poullain, G.² Bouregba, R.³

32
- 21544439412
- 0003-6951,. 10.1063/1.107488
- R. Ramesh, W. K. Chan, B. Wilkens, H. Gilchrist, T. Sands, J. M. Tarascon, V. G. Keramidas, D. K. Fork, J. Lee, and A. Safari, Appl. Phys. Lett. 0003-6951 61, 1537 (1992). 10.1063/1.107488
- (1992) Appl. Phys. Lett. , vol.61 , pp. 1537
- Ramesh, R.¹ Chan, W.K.² Wilkens, B.³ Gilchrist, H.⁴ Sands, T.⁵ Tarascon, J.M.⁶ Keramidas, V.G.⁷ Fork, D.K.⁸ Lee, J.⁹ Safari, A.¹⁰

33
- 69749117758
- arXiv:cond-mat/0206014.
- arXiv:cond-mat/0206014.

34
- 36149021555
- 0096-8250,. 10.1103/PhysRev.98.549
- W. Känzig, Phys. Rev. 0096-8250 98, 549 (1955). 10.1103/PhysRev.98. 549
- (1955) Phys. Rev. , vol.98 , pp. 549
- Känzig, W.¹

35
- 0032568030
- Two-dimensional ferroelectric films
- DOI 10.1038/36069
- A. V. Bune, V. M. Fridkin, S. Ducharme, L. M. Blinov, S. P. Palto, A. V. Sorokin, S. G. Yudin, and A. Zlatkin, Nature (London) 0028-0836 391, 874 (1998). 10.1038/36069 (Pubitemid 28157660)
- (1998) Nature , vol.391 , Issue.6670 , pp. 874-877
- Bune, A.V.¹ Fridkin, V.M.² Ducharme, S.³ Blinov, L.M.⁴ Palto, S.P.⁵ Sorokin, A.V.⁶ Yudin, S.G.⁷ Ziatkin, A.⁸

36
- 2942670851
- Ferroelectricity in ultrathin perovskite films
- DOI 10.1126/science.1098252
- D. D. Fong, G. B. Stephenson, S. K. Streiffer, J. A. Eastman, O. Auciello, P. H. Fuoss, and C. Thompson, Science 0036-8075 304, 1650 (2004). 10.1126/science.1098252 (Pubitemid 38765852)
- (2004) Science , vol.304 , Issue.5677 , pp. 1650-1653
- Fong, D.D.¹ Stephenson, G.B.² Streiffer, S.K.³ Eastman, J.A.⁴ Aucielo, O.⁵ Fuoss, P.H.⁶ Thompson, C.⁷

37
- 2942560487
- 0953-8984,. 10.1088/0953-8984/16/21/002
- M. D. Glinchuk and A. N. Morozovska, J. Phys.: Condens. Matter 0953-8984 16, 3517 (2004). 10.1088/0953-8984/16/21/002
- (2004) J. Phys.: Condens. Matter , vol.16 , pp. 3517
- Glinchuk, M.D.¹ Morozovska, A.N.²

38
- 58149265547
- 0015-0193,. 10.1080/00150190701454628
- M. D. Glinchuk, E. A. Eliseev, and A. N. Morozovska, Ferroelectrics 0015-0193 354, 86 (2007). 10.1080/00150190701454628
- (2007) Ferroelectrics , vol.354 , pp. 86
- Glinchuk, M.D.¹ Eliseev, E.A.² Morozovska, A.N.³

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