A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures

Integrated Ferroelectrics

Volumn 18, Issue 1-4, 1997, Pages 29-37

  Paton, Eric ^a   Brazier, Mark ^a   Mansour, Said ^a   Bement, Arden ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Activation energy; Capacitors; Fatigue; Ferroelectric; PZT; Temperature; Thin Film

Indexed keywords

ACTIVATION ENERGY; CAPACITORS; DEFECTS; ELECTRON TRANSPORT PROPERTIES; FATIGUE OF MATERIALS; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; THERMAL EFFECTS; THIN FILMS;

FERROELECTRIC SWITCHING; LEAD ZIRCONATE TITANATE; TEMPERATURE DEPENDENCE;

DIELECTRIC FILMS;

EID: 0031337602     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708221683     Document Type: Article

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