Investigation of thickness dependence of the ferroelectric properties of Pb(Zr0.6Ti0.4)O3 thin-film capacitors

Journal of Applied Physics

Volumn 99, Issue 3, 2006, Pages

  Bouregba, R ^a   Le Rhun, G ^a   Poullain, G ^a   Leclerc, G ^a  

^a UNIVERSITÉ DE CAEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; ELECTRODES; FERROELECTRIC MATERIALS; HYSTERESIS; MATHEMATICAL MODELS; THIN FILM DEVICES;

MODULATION OF DENSITY; SPACE-CHARGE LAYERS; THIN-FILM CAPACITORS;

LEAD COMPOUNDS;

EID: 33645530912     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2170414     Document Type: Article

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