Analysis of the influence of stress signal frequency on fatigue of ferroelectric thin films

Journal of Applied Physics

Volumn 106, Issue 12, 2009, Pages

  Poullain, G ^a   Cibert, C ^a   Bouregba, R ^a  

^a UNIVERSITÉ DE CAEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLE NUMBER; EXPERIMENTAL DATA; FATIGUE PROPERTIES; IN-BAND; METAL OXIDE SEMICONDUCTOR; MODEL-BASED; REMNANT POLARIZATIONS; STRESS SIGNALS; SURFACE STATE; TIME CONSTANTS;

ELECTRIC CURRENT MEASUREMENT; FERROELECTRIC THIN FILMS; FERROELECTRICITY; SIGNAL PROCESSING;

FERROELECTRIC FILMS;

EID: 73849146380     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3273398     Document Type: Article

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