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Volumn 5, Issue 7, 2005, Pages 1237-1242

Size-dependence of surface plasmon resonance and oxidation for Pd nanocubes synthesized via a seed etching process

Author keywords

[No Author keywords available]

Indexed keywords

CORE-SHELL STRUCTURE; NANOCUBES; SEED ETCHING PROCESS; SIZE-DEPENDENCE;

EID: 23144455633     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0508826     Document Type: Article
Times cited : (398)

References (66)
  • 3
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    • Catalysis and optics: (a) Lewis, L. N. Chem. Rev. 1993, 93, 2693.
    • (1993) Chem. Rev. , vol.93 , pp. 2693
    • Lewis, L.N.1
  • 7
    • 0034860565 scopus 로고    scopus 로고
    • Electronics and optoelectronics: (a) El-Sayed, M. A. Acc. Chem. Res. 2001, 34, 257.
    • (2001) Acc. Chem. Res. , vol.34 , pp. 257
    • El-Sayed, M.A.1
  • 45
  • 51
    • 23144448041 scopus 로고    scopus 로고
    • note
    • 3 solution (in EG) before syringe pumping. The samples were washed with acetone and then with ethanol several times to remove most of the EG and PVP by centrifugation. The as-obtained samples were then characterized by transmission electron microscopy (TEM), high-resolution TEM (HRTEM), and powder X-ray diffraction (XRD). A drop of the aqueous suspension of particles was placed on a piece of carbon-coated copper grid (Ted Pella, Redding, CA) for TEM and dried under ambient conditions. The grid was then transferred to a gravity-fed flow cell and washed for 1 h with deionized water to remove the excess PVP. Finally, the sample was dried and stored in a vacuum for TEM characterization. TEM images were taken on a Phillips 420 transmission electron microscope operated at 120 kV. HRTEM images were taken on a JEOL 2010 LaB6 high-resolution transmission electron microscope operated at 200 kV. Powder XRD patterns were recorded on a Philips 1820 diffractometer equipped with a Cu Kα radiation source (λ = 1.54180 Å). UV-vis spectra were obtained using a Hewlett-Packard 8452A diode array spectrophotometer.


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