Volta potential of oxidized aluminum studied by scanning kelvin probe force microscopy

Journal of Physical Chemistry C

Volumn 114, Issue 18, 2010, Pages 8474-8484

  Yasakau, Kiryl A ^a   Salak, Andrei N ^a   Zheludkevich, Mikhail L ^a   Ferreira, Mário G S ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM SURFACE; ANNEALING TEMPERATURES; ANODIC FILMS; ANODIZATIONS; BOILING WATER; BORIC ACIDS; CHARGE REDISTRIBUTION; EMBEDDED CHARGE; LAYER THICKNESS; LINEAR DEPENDENCE; NEUTRAL SOLUTION; OXIDE LAYER; SCANNING KELVIN PROBE FORCE MICROSCOPY; THERMAL OXIDATION; THERMALLY OXIDIZED; VOLTA POTENTIAL; VOLTA-POTENTIAL DIFFERENCE;

ALUMINUM; ANNEALING; INORGANIC ACIDS; METALLIC FILMS; OXIDATION; PROBES;

DEFECTS;

EID: 77952059881     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1011044     Document Type: Article

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