Characterization of AA2024-T3 by scanning Kelvin probe force microscopy

Journal of the Electrochemical Society

Volumn 145, Issue 7, 1998, Pages 2285-2295

  Schmutz, P ^a   Frankel, G S ^a,b  

^a Ohio State University   (United States)

^b ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM CORROSION; ATOMIC FORCE MICROSCOPY; INTERMETALLICS; SURFACES;

ALUMINUM ALLOYS AA2024 T3; SCANNING KELVIN PROBE MICROSCOPY; VOLTA POTENTIAL;

ALUMINUM ALLOYS;

EID: 0032123781     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838633     Document Type: Article

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