Anodization behavior of Al, and physical and electrical characterization of its oxide films

Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 5828-5836

  Ozawa, Kiyoshi ^a   Majima, Teiji ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000184672     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363575     Document Type: Review

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