The new Surrey ion beam analysis facility

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 219-220, Issue 1-4, 2004, Pages 405-409

  Simon, A ^a,e   Jeynes, C ^a   Webb, R P ^a   Finnis, R ^a   Tabatabaian, Z ^a   Sellin, P J ^a   Breese, M B H ^b   Fellows, D F ^c   Van den Broek, R ^d   Gwilliam, R M ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c Arun Microelectronics Ltd   (United Kingdom)

^d High Voltage Engineering BV   (Netherlands)

^e INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

BEAMLINE; DATA COLLECTION; ION BEAM ANALYSIS; TERMINAL VOLTAGE;

COMPUTER CONTROL; DATA ACQUISITION; ELECTRIC POTENTIAL; GONIOMETERS; LENSES; METAL DETECTORS; RESONANCE; TEMPERATURE CONTROL;

ION BEAMS;

EID: 2342559165     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.091     Document Type: Conference Paper

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