Effect of indium dopant on surface and mechanical characteristics of ZnO : iiin nanostructured films

Journal of Physics D: Applied Physics

Volumn 41, Issue 24, 2008, Pages

  Fang, Te Hua ^a   Kang, Shao Hui ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BUCKLING BEHAVIOUR; CHEMICAL SOLUTION METHOD; FRACTURE STRENGTHS; INDENTATION DEPTH; INDENTATION PROCESS; INDIUM DOPANTS; MECHANICAL CHARACTERISTICS; NANO-INDENTATION MEASUREMENTS; NANOROD FILMS; NANOSTRUCTURED FILMS; SCANNING ELECTRON MICROSCOPE; SPUTTERED SEED LAYERS; STRUCTURAL AND SURFACE CHARACTERIZATION; YOUNG'S MODULUS; ZNO;

ANGLE MEASUREMENT; CONTACT ANGLE; ELASTIC MODULI; ELASTICITY; HARDNESS; INDIUM; MICROSCOPES; NANOINDENTATION; NANORODS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; X RAY DIFFRACTION; ZINC OXIDE;

EPITAXIAL FILMS;

EID: 77951228967     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/24/245303     Document Type: Article

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