Phase relationships and physical properties of homologous compounds in the zinc oxide-indium oxide system

Journal of the American Ceramic Society

Volumn 81, Issue 5, 1998, Pages 1310-1316

  Moriga, Toshihiro ^a,c,d   Edwards, Doreen D ^a,d   Mason, Thomas O ^a,d   Palmer, George B ^b   Poeppelmeier, Kenneth R ^b,d   Schindler, Jon L ^a,e   Kannewurf, Carl R ^a   Nakabayashi, Ichiro ^c  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c UNIVERSITY OF TOKUSHIMA   (Japan)

^d AMERICAN CERAMIC SOCIETY   (United States)

^e MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; PHASE DIAGRAMS; PHASE EQUILIBRIA; TRANSPARENCY; X RAY DIFFRACTION ANALYSIS;

SOLID STATE REACTION; ZINC INDIUM OXIDE;

ZINC COMPOUNDS;

EID: 0032071816     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02483.x     Document Type: Article

References (15)

1. N. R. Lyman, "Transparent Electronic Conductors"; pp. 201-31 in Proceedings of the Symposium on Electrochromic Materials, Electrochemical Society Proceedings, Vols. 90-92. Electrochemical Society, Princeton, NJ, 1990.
2. R. Wang, L. H. L. King, and A. W. Sleight, "Highly Conducting Transparent Thin Films Based on Zinc Oxide," J. Mater. Res., 11 [7] 1659-64 (1996).
3. 3-ZnO Films by Radio Frequency Magnetron Sputtering,' J. Vac. Sci. Technol., A, 14 [3] 1704-708 (1996).
4. 5 Thin Films Prepared by RF Magnetron Sputtering," Jpn. J. Appl. Phys., Part 2, 34 [8A] L971-L974 (1995).
5. J. M. Phillips, R. J. Cava, G. A. Thomas, S. A. Carter, J. Kwo, T. Siegrist, J. J. Krajewski, J. H. Marshall, W. F. Peck Jr., and D. H. Rapkine, "Zinc-Indium-Oxide: A High Conductivity Transparent Conducting Oxide," Appl. Phys. Lett., 67 [15] 2246-48 (1994).
6. 3," Z. Anorg. Allg. Chem., 349 [3-4] 113-224 (1967).
7. 4-ZnO System at 1350°C," J. Solid State Chem., 86, 16-40 (1990).
8. 4-ZnO System," J. Solid State Chem., 116, 170-78 (1994).
9. 3 System," J. Solid State Chem., 73, 418-26 (1988).
10. 111In-TDPAC Studies," J. Solid State Chem., 122, 166-75 (1996).
11. 3 System," J. Am. Ceram. Soc., 79 [8] 2193-96 (1996).
12. F. M. Smits, "Measurement of Sheet Resistivities with the Four-Point Probe," Bell Syst. Tech. J., 37 [3] 711-18 (1958).
13. L. A. Bursill and G. G. Stone, "Tunnel and Intergrowth Structures in the Gallia-rich Gallium Titanate System," J. Solid State Chem., 38, 149-57 (1981).
14. H. G. Hecht, "The Present Status of Diffuse Reflectance Theory"; pp. 1-26 in Modern Aspects of Reflectance Spectroscopy. Edited by W. W. Wendlandt. Plenum Press, New York, 1968.
15. 3 Films: Basic Optical Properties and Applications to Energy-Efficient Windows," J. Appl. Phys., 60 [11] R123-R160 (1986).