Design technique for mitigation of soft errors in differential switched-capacitor circuits

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 55, Issue 9, 2008, Pages 838-842

  Fleming, Patrick R ^a   Olson, Brian D ^b   Holman, W Timothy ^b   Bhuva, Bharat L ^b   Massengill, Lloyd W ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b NONE

Author keywords

Analog; Mixed signal; Radiation hardened by design (RHBD); Single event effect; Switched capacitor

Indexed keywords

DIFFERENTIAL AMPLIFIERS; HARDENING; RADIATION HARDENING; TIMING CIRCUITS;

ANALOG; MIXED SIGNAL; RADIATION HARDENED BY DESIGN; SINGLE EVENT EFFECTS; SWITCHED CAPACITOR;

DESIGN;

EID: 51649101771     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2008.923437     Document Type: Article

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