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Volumn 39, Issue 3, 2010, Pages 295-302
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A study of plasma-cleaned Ag-plated Cu leadframe surfaces
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Author keywords
Antitarnish layer; Copper; Integrated circuits (IC) packaging; Leadframe; Plasma cleaning; Silver
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Indexed keywords
ANTITARNISH LAYER;
AR PLASMAS;
BEFORE AND AFTER;
BENZOTRIAZOLES;
CROSS CONTAMINATION;
CU ATOMS;
CU SURFACES;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
HIGH-POWER;
LEAD-FRAME;
LOW POWER;
PLASMA CLEANING;
PLASMA TREATMENT;
REDEPOSITION;
TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;
CLEANING;
CONTACT ANGLE;
INTEGRATED CIRCUITS;
MASS SPECTROMETRY;
OPTICAL DEVICES;
PLASMA APPLICATIONS;
SCANNING ELECTRON MICROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
PLASMAS;
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EID: 77951022976
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-009-1016-8 Document Type: Article |
Times cited : (17)
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References (17)
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