Current signatures: Application

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1168-1177

  Gattiker, Anne E ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS;

CURRENT SIGNATURE TESTING; IDDQ TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0032319684     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)