CROWNE: Current ratio outliers with neighbor estimator

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 132-139

  Sabade, Sagar S ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FAULT TOLERANCE; INTEGRATED CIRCUIT TESTING; STATISTICS;

FABRICATION PROCESS; FREE PARAMETERS; INDUSTRIAL TESTS; LOCAL VARIATIONS; NEIGHBOR CURRENT RATIOS; NON-CONFORMANCE; PROCESS VARIATION; TEST PARAMETERS;

DESIGN FOR TESTABILITY;

EID: 84971277840     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250104     Document Type: Conference Paper

References (11)

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