Surface bonding on silicon surfaces as probed by Tip-enhanced Raman spectroscopy

Science China Chemistry

Volumn 53, Issue 2, 2010, Pages 426-431

  Zhuang, Mu De ^a   Liu, Zheng ^a   Ren, Bin ^a   Tian, Zhong Qun ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

4 ethylpyridine; Silicon single crystal; Surface modification; Tip enhanced Raman spectroscopy

Indexed keywords

4-VINYLPYRIDINE; AG NANOPARTICLE; HYDROGEN-TERMINATED SILICON SURFACES; NANOSCALE TIP; NON-INVASIVE; PHONON VIBRATIONS; RAMAN ENHANCEMENT; RAMAN SIGNAL; SCANNING TUNNELING MICROSCOPES; SILICON SINGLE CRYSTALS; SILICON SURFACES; SURFACE BONDING; SURFACE ENHANCEMENT; SURFACE SPECIES; SURFACE-ENHANCED RAMAN SCATTERING; TIP-ENHANCED RAMAN SPECTROSCOPY; UV LIGHT; VIBRATIONAL INFORMATION;

NANOPARTICLES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILVER; SINGLE CRYSTAL SURFACES; SUBSTRATES;

SILICON WAFERS;

EID: 77950940278     PISSN: 16747291     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11426-010-0068-1     Document Type: Article

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