SCOPUS 정보 검색 플랫폼

Volumn 107, Issue 6, 2010, Pages

Structural and optoelectronical characterization of Si- SiO2 / SiO2 multilayers with applications in all Si tandem solar cells

(8) Maestre, D a Palais, O a Barakel, D a Pasquinelli, M a Alfonso, C a Gourbilleau, F b De Laurentis, M c Irace, A c

a AIX MARSEILLE UNIVERSITÉ (France)

b UNIVERSITÉ DE CAEN (France)

c UNIVERSITY OF NAPLES FEDERICO II (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CHARACTERIZATION; FILTERED IMAGES; HIGH DENSITY; HIGH RESISTANCE; I - V CURVE; NANO-STRUCTURED; REACTIVE MAGNETRON SPUTTERING; RECOMBINATION LIFETIME; SI NANOCRYSTAL; TANDEM SOLAR CELLS; TEM; UNIFORM SIZE;

MULTILAYERS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WELLS; SILICON; SILICON COMPOUNDS; SOLAR CELLS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77950563108 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3309761 Document Type: Conference Paper

Times cited : (8)

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