All-optical multiwavelength technique for the simultaneous measurement of bulk recombination lifetimes and front/rear surface recombination velocity in single crystal silicon samples

Journal of Applied Physics

Volumn 93, Issue 6, 2003, Pages 3407-3413

  Sirleto, Luigi ^a   Irace, Andrea ^b   Vitale, Gianfranco ^b   Zeni, Luigi ^c   Cutolo, Antonello ^d  

^a CNR   (Italy)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^c SECOND UNIVERSITY OF NAPLES   (Italy)

^d UNIVERSITY OF SANNIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; LASER PULSES; PUMPING (LASER); SILICON WAFERS;

MULTIWAVELENGTH PUMPING;

LASER OPTICS;

EID: 0037444830     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556567     Document Type: Article

References (11)

1. T. S. Horanyi, T. Pavelka, and P. Tüttö, Appl. Surf. Sci. 63, 306 (1993).
2. J. Schmidt and A. J. Aberle, J. Appl. Phys. 81, 6186 (1997).
3. J. Linnros, J. Appl. Phys. 84, 275 (1998).
4. J. Linnros, J. Appl. Phys. 84, 284 (1998).
5. L. Luke and L. Cheng, J. Appl. Phys. 61, 2282 (1987).
6. G. S. Kousik, Z. G. Ling, and P. K. Ajmera, J. Appl. Phys. 72, l (1992).
7. A. Buczkowski, Z. J. Radzimski, G. A. Rozgonyi, and F. Shimura, J. Appl. Phys. 69, 6495 (1991).
8. H. C. Ostendorf and A. L. Endros, Appl. Phys. Lett. 71, 3275 (1997).
9. MATLAB Ver. 6 User Manual, The Mathworks (2002).
10. A. Schonecher, J. A. Eikelboom, A. R. Burgers, P. Lolgen, C. Leguijt, and W. C. Sinke, J. Appl. Phys. 79, 1497 (1996).
11. J. Schmidt, IEEE Trans. Electron Devices 46, 2018 (1999).