Multi-wavelength transverse probe lifetime measurement for the characterization of recombination lifetime in thin mc-Si samples for photovoltaic industry use

Solar Energy Materials and Solar Cells

Volumn 84, Issue 1-4, 2004, Pages 83-92

  Irace, A ^a   Sorrentino, F ^a   Vitale, G F ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Multi crystalline silicon; Recombination lifetime measurement; Solar cell; Surface recombination velocity; Transverse probe

Indexed keywords

COMPUTER SIMULATION; COSTS; MATHEMATICAL MODELS; SILICON; SOLAR CELLS; SURFACE TREATMENT; VELOCITY MEASUREMENT;

OPTICAL MEASUREMENT; RECOMBINATION LIFETIME MEASUREMENT; SURFACE RECOMBINATION VELOCITY (SRV); TRANSVERSE PROBE;

SOLAR ENERGY;

EID: 4243152974     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.02.039     Document Type: Conference Paper

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