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Volumn 518, Issue 14, 2010, Pages 3898-3902

Structural and optical properties of γ-alumina thin films prepared by pulsed laser deposition

Author keywords

Alumina; Ellipsometry; Pulsed laser deposition; Thin films; X ray diffraction

Indexed keywords

ALUMINA THIN FILMS; ANGLES OF INCIDENCE; CONTACT MODES; CUBIC STRUCTURE; ENERGY RANGES; OXYGEN PARTIAL PRESSURE; POLYCRYSTALLINE; ROOT MEAN SQUARE; SILICON SUBSTRATES; STRUCTURAL AND OPTICAL PROPERTIES;

EID: 77950532936     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.12.001     Document Type: Article
Times cited : (47)

References (36)
  • 30
    • 0003592140 scopus 로고
    • Chrisey D.B., and Hubler G.B. (Eds), Wiley, New York
    • In: Chrisey D.B., and Hubler G.B. (Eds). Pulsed Laser Deposition of Thin Films (1994), Wiley, New York
    • (1994) Pulsed Laser Deposition of Thin Films


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.