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Volumn 518, Issue 14, 2010, Pages 3898-3902
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Structural and optical properties of γ-alumina thin films prepared by pulsed laser deposition
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Author keywords
Alumina; Ellipsometry; Pulsed laser deposition; Thin films; X ray diffraction
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Indexed keywords
ALUMINA THIN FILMS;
ANGLES OF INCIDENCE;
CONTACT MODES;
CUBIC STRUCTURE;
ENERGY RANGES;
OXYGEN PARTIAL PRESSURE;
POLYCRYSTALLINE;
ROOT MEAN SQUARE;
SILICON SUBSTRATES;
STRUCTURAL AND OPTICAL PROPERTIES;
AMORPHOUS MATERIALS;
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
ELLIPSOMETRY;
LIGHT REFRACTION;
OPTICAL FILMS;
ORGANIC POLYMERS;
OXYGEN;
PARTIAL PRESSURE;
POSITIVE IONS;
PULSED LASER DEPOSITION;
PULSED LASERS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SINTERED ALUMINA;
SINTERING;
SURFACE ROUGHNESS;
THIN FILMS;
TOPOGRAPHY;
X RAY DIFFRACTION;
FILM PREPARATION;
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EID: 77950532936
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.12.001 Document Type: Article |
Times cited : (47)
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References (36)
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