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Volumn 254, Issue 13, 2008, Pages 4179-4185

Structural and electrical properties of zinc oxides thin films prepared by thermal oxidation

Author keywords

Electrical conductivity; Thin films; Vacuum deposition; XRD; ZnO

Indexed keywords

ELECTRIC CONDUCTIVITY; VACUUM DEPOSITION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 41949114008     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.12.055     Document Type: Article
Times cited : (61)

References (36)
  • 13
    • 41949089104 scopus 로고    scopus 로고
    • ASTM X-ray Powder Diffraction Data File, Card 5-0664.
    • ASTM X-ray Powder Diffraction Data File, Card 5-0664.
  • 15
    • 0004274069 scopus 로고
    • Wiley-Interscience, New York
    • Wolf H.F. Semiconductors (1971), Wiley-Interscience, New York
    • (1971) Semiconductors
    • Wolf, H.F.1
  • 17
    • 0003680984 scopus 로고
    • Maissel L.I., and Glang R. (Eds), McGraw Hill Hook Company
    • In: Maissel L.I., and Glang R. (Eds). Handbook of Thin Film Technology (1970), McGraw Hill Hook Company
    • (1970) Handbook of Thin Film Technology


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.