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Volumn 42, Issue 1-6, 2007, Pages 116-122

Preparation and characterization of ZnO thin films prepared by thermal oxidation of evaporated Zn thin films

Author keywords

Electrical and optical properties; Oxidation process; Thin films; X ray diffraction; Zinc oxide

Indexed keywords

OPTICAL PROPERTIES; OXIDATION; THERMAL EVAPORATION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 34548496713     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2007.04.021     Document Type: Article
Times cited : (62)

References (22)
  • 11
    • 34548474507 scopus 로고    scopus 로고
    • ASTM X-ray powder data file, card no. 4-0831
  • 12
    • 34548494324 scopus 로고    scopus 로고
    • ASTM X-ray powder data file, card no. 5-0664


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.