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Volumn 96, Issue 13, 2010, Pages

Mg doping of GaN grown by plasma-assisted molecular beam epitaxy under nitrogen-rich conditions

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTOR DOPING; CONTACT LAYERS; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DOPING EFFICIENCY; DOPING LEVELS; HALL MEASUREMENTS; HIGH GROWTH TEMPERATURES; INGAN/GAN; MG FLUX; MG-DOPED; MG-DOPING; OPTICAL QUALITIES; P-DOPING; PHOTOLUMINESCENCE MEASUREMENTS; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; QUANTUM-DOT LIGHT EMITTING DIODES; RICH CONDITIONS; ROOM TEMPERATURE; SERIES RESISTANCES;

EID: 77950514128     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3374882     Document Type: Article
Times cited : (41)

References (14)
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    • DOI 10.1063/1.2137446, 103531
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  • 12
    • 13644274232 scopus 로고    scopus 로고
    • Continuous evolution of Ga adlayer coverages during plasma-assisted molecular-beam epitaxy of (0001) GaN
    • DOI 10.1063/1.1853530, 041908
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  • 13
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    • Garcia, R.1    Thomas, A.C.2    Ponce, F.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.