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Volumn 209, Issue , 2010, Pages
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Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
CHARACTERIZATION;
ION BEAMS;
MAGNETIC SEMICONDUCTORS;
NANOTECHNOLOGY;
PROBES;
PULSED LASERS;
QUANTUM DOT LASERS;
SEMICONDUCTOR LASERS;
SEMICONDUCTOR QUANTUM DOTS;
ATOM PROBE TOMOGRAPHY;
COMPOUND SEMICONDUCTORS;
MAGNETIC CHARACTERISTIC;
MORPHOLOGY AND COMPOSITION;
NANOSCALE CHARACTERIZATION;
NANOSCALE RESOLUTIONS;
QUANTUM DOT MATERIALS;
TOMOGRAPHIC TECHNIQUES;
ATOM LASERS;
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EID: 77950464133
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/209/1/012026 Document Type: Conference Paper |
Times cited : (6)
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References (20)
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