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Volumn 209, Issue , 2010, Pages

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARACTERIZATION; ION BEAMS; MAGNETIC SEMICONDUCTORS; NANOTECHNOLOGY; PROBES; PULSED LASERS; QUANTUM DOT LASERS; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM DOTS;

EID: 77950464133     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/209/1/012026     Document Type: Conference Paper
Times cited : (6)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.