Strong-field photoionization of sputtered neutral molecules for molecular depth profiling

Journal of Physical Chemistry C

Volumn 114, Issue 12, 2010, Pages 5391-5399

  Willingham, D ^a   Brenes, D A ^a   Wucher, A ^b   Winograd, N ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AG SUBSTRATE; ALTERED LAYER; CHEMICAL COMPOSITIONS; CLUSTER ION BEAMS; DEPTH PROFILE; FEMTOSECONDS; FRAGMENT IONS; GUANINE MOLECULES; INTERFACIAL CHEMICALS; IONIZATION PROBABILITIES; MOLECULAR DEPTH; MOLECULAR DEPTH PROFILING; MOLECULAR IONS; NEUTRAL MOLECULES; ORGANIC THIN FILMS; PROTONATED MOLECULAR IONS; SECONDARY IONS; STEADY-STATE VALUES; TIME OF FLIGHT; TOF SIMS;

ION BEAMS; ION SOURCES; MOLECULES; NEGATIVE IONS; PARTICLE DETECTORS; PHOTOIONIZATION; POSITIVE IONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILVER;

DEPTH PROFILING;

EID: 77950211262     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp9054632     Document Type: Article

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