Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 831-833

  Willingham, D ^a   Kucher, A ^a   Winograd, N ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

3D imaging; C 60; Depth profiling; Laser postionization

Indexed keywords

ATOMIC BEAMS; ATOMIC FORCE MICROSCOPY; DESORPTION; ELECTROMAGNETIC PULSE; FEMTOSECOND LASERS; ION BEAMS; ION SOURCES; MOLECULAR IMAGING; MOLECULES; MULTIPHOTON PROCESSES; PHOTOIONIZATION; PHYSICAL VAPOR DEPOSITION;

3D IMAGING; CLUSTER ION SOURCES; DESORPTION PROCESS; HIGH POWER FEMTOSECOND PULSE; LASER POSTIONIZATION; MOLECULAR DEPTH PROFILING; MULTIPHOTON IONIZATION; PHOTOFRAGMENTATION;

DEPTH PROFILING;

EID: 56449117102     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.123     Document Type: Article

References (8)

1. Vorsa V., et al. Anal. Chem. 71 (1999) 574
2. Wucher A., et al. Anal. Chem. 76 (2004) 7234-7242
3. Willey K.F., Vorsa V., Braun R.M., and Winograd N. Rapid Commun. Mass Spec. 12 (1998) 1253
4. Zhu Z., Allara D.L., and Winograd N. Appl. Surf. Sci. 252 (2006) 6686-6688
5. Pachuta S.J., et al. J. Am. Chem. Soc. 110 (1988) 657
6. Kühlewind H., Kiermeier A., and Neusser H.J. J. Chem. Phys. 85 (1986) 4427
7. Sun S., Szakal C., and Winograd N. J. Am. Soc. Mass Spectromet. 16 (2005) 1676-1677
8. Wucher A., Cheng J., and Winograd N. Anal. Chem. 79 (2007) 5529-5539