Molecular depth profiling of trehalose using a C 60 cluster ion beam

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 959-961

  Wucher, Andreas ^a   Cheng, Juan ^b   Winograd, Nicholas ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

3D imaging; Depth scale calibration; Molecular depth profiling

Indexed keywords

ION BEAMS; IONS; KINETIC ENERGY; KINETICS; SECONDARY ION MASS SPECTROMETRY;

3D IMAGING; CLUSTER ION BEAMS; DEPTH RESOLUTION; DEPTH SCALE CALIBRATION; FULLERENE ION BEAM; MOLECULAR DEPTH PROFILING; ORGANIC OVERLAYERS; PROJECTILE IONS;

DEPTH PROFILING;

EID: 56449097682     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.248     Document Type: Article

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