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Volumn 252, Issue 19, 2006, Pages 6526-6528
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Fundamental studies of the cluster ion bombardment of water ice
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Author keywords
C 60 +; Cluster ion; Sputter yield; ToF SIMS; Water ice
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Indexed keywords
DEPOSITION;
FULLERENES;
QUARTZ;
SECONDARY ION MASS SPECTROMETRY;
SPUTTERING;
SURFACE PHENOMENA;
CLUSTER ION;
MOLECULAR DEPTH PROFILING;
TOF-SIMS;
WATER ICE;
ICE;
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EID: 33747158515
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.02.208 Document Type: Article |
Times cited : (16)
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References (12)
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