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Volumn 312, Issue 10, 2010, Pages 1726-1730

Study of the structural and photoluminescence properties of CdTe polycrystalline films deposited by close-spaced vacuum sublimation

Author keywords

A1. Crystal structure; A1. Defects; A1. X ray diffraction; A3. Polycrystalline deposition; B1. Cadmium compounds

Indexed keywords

A1. CRYSTAL STRUCTURE; A3. POLYCRYSTALLINE DEPOSITION; B1. CADMIUM COMPOUNDS; CDTE; DIFFERENT SUBSTRATES; DIFFRACTION PEAKS; DOMAIN SIZE; EXTENDED DEFECT; GRAIN SIZE; GROWTH CONDITIONS; GROWTH MECHANISMS; LOW TEMPERATURE PHOTOLUMINESCENCE; MEAN DENSITY; MICRODEFORMATIONS; OPTICAL QUALITIES; PHOTOLUMINESCENCE PROPERTIES; POLY CRYSTALLINE DEPOSITION; POLYCRYSTALLINE; POLYCRYSTALLINE FILM; VACUUM SUBLIMATION; X-RAY DIFFRACTION MEASUREMENTS;

EID: 77950188267     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.02.034     Document Type: Article
Times cited : (67)

References (33)
  • 7
    • 0004095824 scopus 로고
    • Semiconductors and semimetals
    • Academic Press, New York p. 196
    • Zanio K. Semiconductors and semimetals. Cadmium Telluride (1978), Academic Press, New York p. 196
    • (1978) Cadmium Telluride
    • Zanio, K.1
  • 21
    • 77950189541 scopus 로고    scopus 로고
    • JCPDS, International Centre for Diffraction Data
    • JCPDS, International Centre for Diffraction Data, USA, Card Number 75-2086.
    • USA, Card , Issue.75-2086


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.