Thickness-dependence of stoichiometry and microstructure characteristics in correlation with conductivity type of CdTe films

Thin Solid Films

Volumn 423, Issue 2, 2003, Pages 146-152

  Ramadan, A A ^a   Abd El Mongy, A ^a   Ahmed Farag, I S ^b   El Shabiny, A M ^b   Radwan, F A ^a   Ismail, H I ^a   Hashem, H M ^a  

^a Helwan University   (Egypt)

^b NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

CdTe films; Lattice defects; Native doping; Structure characteristics

Indexed keywords

CADMIUM COMPOUNDS; CRYSTAL DEFECTS; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; PHYSICAL VAPOR DEPOSITION; STOICHIOMETRY;

NATIVE DOPING;

THIN FILMS;

EID: 0037439484     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01018-0     Document Type: Article

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