Characterization of CdTe thin film - Dependence of structural and optical properties on temperature and thickness

Solar Energy Materials and Solar Cells

Volumn 82, Issue 1-2, 2004, Pages 187-199

  Lalitha, S ^a   Sathyamoorthy, R ^a   Senthilarasu, S ^a   Subbarayan, A ^a   Natarajan, K ^a  

^a KONGUNADU ARTS AND SCIENCE COLLEGE   (India)

Author keywords

CdTe; Optical; SCLC; Structure; Vacuum evaporation

Indexed keywords

CHARGE TRANSFER; COMPUTATIONAL METHODS; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); EVAPORATION; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; THIN FILMS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

OPTICAL; SCSL; STRUCTURE; VACUUM EVAPORATION;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 1942473117     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.01.017     Document Type: Conference Paper

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