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Volumn 37, Issue 4, 2002, Pages 329-339
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Microstructural characterization of electrosynthesized ZnTe thin films
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Author keywords
Electrosynthesis; Line broadening; Microstructural parameters; Surface morphology; Zinc telluride
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Indexed keywords
BATH TEMPERATURE;
CRYSTALLITE SIZE;
DISLOCATION DENSITY;
ELECTROSYNTHESIS;
MICROSTRUCTURAL CHARACTERIZATION;
X RAY LINE PROFILE ANALYSIS;
ZINC TELLURIDE;
CRYSTAL ORIENTATION;
DISLOCATIONS (CRYSTALS);
ELECTROCHEMISTRY;
MORPHOLOGY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GLASS;
SEMICONDUCTING ZINC COMPOUNDS;
STACKING FAULTS;
SUBSTRATES;
SYNTHESIS (CHEMICAL);
THIN FILMS;
X RAY CRYSTALLOGRAPHY;
CRYSTAL MICROSTRUCTURE;
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EID: 0036091064
PISSN: 02321300
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-4079(200204)37:4<329::AID-CRAT329>3.0.CO;2-U Document Type: Article |
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Times cited : (53)
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References (21)
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