Substrate-temperature effect on the microstructural and optical properties of ZnS thin films obtained by close-spaced vacuum sublimation

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 7, 2009, Pages 1549-1557

  Kurbatov, D ^a   Opanasyuk, A ^a   Khlyap, H ^b  

^a SUMY STATE UNIVERSITY   (Ukraine)

^b University of Koblenz Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TEMPERATURES; DOMAIN SIZE; EXTINCTION COEFFICIENTS; GROWTH CONDITIONS; LATTICE PARAMETERS; LAYERS MORPHOLOGY; MICRO-STRAIN; MICRO-STRUCTURAL; OPTICAL CHARACTERISTICS; RED EDGE; SPECTRAL DISTRIBUTION; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL FILMS; SUBSTRATE TEMPERATURE; TEMPERATURE EFFECTS; TRANSMISSION COEFFICIENTS; VACUUM SUBLIMATION; X-RAY DIFFRACTION METHOD; ZNS FILMS; ZNS THIN FILMS;

FILM GROWTH; GRAIN GROWTH; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EFFECTS; VACUUM; ZINC SULFIDE;

OPTICAL FILMS;

EID: 67650422640     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200824472     Document Type: Article

References (23)

1. R. Bhargava, Properties of Wide Band Gap II-VI Semiconductors (IEE/Inspec, London, 1997), p. 238.
2. D. Hariskos, S. Spiering, and M. Powalla, Thin Solid Films 480/481, 99-109 (2005).
3. L. X. Shao, K. H. Chang, and H. L. Hwang, Appl. Surf. Sci. 212, 305-310 (2003).
4. B. Elidrissi, M. Addou, and M. Regragui, Mater. Chem. Phys. 68, 175-179 (2001).
5. S. Yano, R. Schroeder, B. Ulrich et al., Thin Solid Films 423(2), 273-276 (2003).
6. S. Wang, X. Fu, G. Xia et al., Appl. Surf. Sci. 252, 8734-8737 (2006).
7. G. Y. Chung, S. Ch. Park, K. Cho et al., J. Appl. Phys. 78(9), 5493-5498 (1995).
8. S. Armstrong, P. K. Datta, and R. W. Miles, Thin Solid Films 403/404, 126-129 (2002).
9. S. N. Alamri, Phys. Status Solidi A 200(2), 352-360 (2003).
10. Y. P. Venkata Subbaiah, P. Prathap, and K. T. R. Reddy, Appl. Surf. Sci. 253, 2409-2415 (2006).
11. P. Prathap, N. Revathi, Y. P. Venkata Subbaiah, and K. T. R. Reddy, J. Phys.: Condens. Matter 20, 035205 (2008).
12. Y. P. V. Subbaiah, P. Prathap, M. Devika, and K. T. R. Reddy, Physica B 365, 240-246 (2005).
13. Selected powder diffraction data for education straining (Search manual and data cards). (International Centre for Diffraction Data, USA, 1988), p. 432.
14. B. E. Warren, X-ray Diffraction (Dover, New York, 1990), p. 253.
15. S. N. Danilchenko, O. G. Kukharenko, and C. Moseke, Cryst. Res. Technol. 37(11), 1234-1240 (2002).
16. D. Kurbatov, A. Opanasyk, V. Denisenko et al., EBSCO: Semicond. Phys. Quantum Electron. Optoelectron. 11(4), 252-256 (2008).
17. Y. Yan, M. M. Al-Jassim, K. M. Jones et al., Appl. Phys. Lett. 77(10), 1461-1463 (2000).
18. G. H. Stout and L. H. Jensen, X-ray Structure Determination: A Practical Guide (John Wiley and Sons, New York, 1989), p. 449.
19. I. P. Kalinkin, V. B. Aleskovsky, and A. V. Simashkevich, Epitaxial Films of II-VI Compounds (Leningrad University Publishers, Leningrad, 1978) (in Russian).
20. J. Luschitz, K. Lakus-Wollny, A. Klein et al., Thin Solid Films 515(15), 5814-5818 (2007).
21. M. Aven and J. S. Prener, Physics and Chemistry of II-VI Compounds (North-Holland, Amsterdam, 1967).
22. J. Wang and M. Isshiki, Springer Handbook of Electronic and Photonic Materials (Springer, Berlin, New York, 2006), part B 16.
23. S. Aksay and B. Altiokka, Phys. Status Solidi C 4(2), 585-588 (2007).