Reliability evaluation for Blu-Ray laser diodes

Microelectronics Reliability

Volumn 50, Issue 4, 2010, Pages 467-470

  Meneghini, Matteo ^a   Trivellin, Nicola ^a   Orita, Kenji ^b   Yuri, Masaaki ^b   Tanaka, Tsuyoshi ^b   Ueda, Daisuke ^b   Zanoni, Enrico ^a   Meneghesso, Gaudenzio ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BLU-RAY; DEGRADATION KINETICS; DEGRADATION PROCESS; DEGRADATION RATE; DRIVING FORCES; LASER DIODES; NON-RADIATIVE RECOMBINATIONS; OPTICAL DATA STORAGE SYSTEMS; OPTICAL POWER; RELIABILITY EVALUATION;

DIODES; OPTICAL DATA PROCESSING; OPTICAL DATA STORAGE; OPTICAL PROPERTIES; RELIABILITY ANALYSIS;

DEGRADATION;

EID: 77950020858     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.01.034     Document Type: Article

References (14)

1. Ohta M., Ohizumi Y., Hoshina Y., Tanaka T., Yabuki Y., Funato K., et al. High-power pure blue laser diodes. Phys Status Solidi (a) 204 6 (2007) 2068-2072
2. Bergh A. Blue laser diode (LD) and light emitting diode (LED) applications. Phys Status Solidi (a) 201 12 (2004) 2740-2754
3. Resch K.J., et al. Distributing entanglement and single photons through an intra-city, free-space quantum channel. Opt Express 13 1 (2005) 202-209
4. Nakamura S. Present status of InGaN-based laser diodes. Phys Status Solidi (a) 176 (1999) 15-22
5. Kummler V., Bruderl G., Bader S., Miller S., Weimar A., Lell A., et al. Degradation analysis of InGaN laser diodes. Phys Status Solidi (a) 194 (2002) 419
6. Furitsch M., Avramescu A., Eichler C., Engl K., Leber A., Miler A., et al. Comparison of degradation mechanisms of blue-violet laser diodes grown on SiC and GaN substrates. Phys Status Solidi 203 7 (2006) 1797-1801
7. Marona L., Wisniewski P., Prystawko P., Grzegory I., Suski T., Porowski S., et al. Degradation mechanisms in InGaN laser diodes grown on bulk GaN crystals. Appl Phys Lett 88 (2006) 201111-1-201111-3
8. Tomiya S., Hino T., Goto S., Takeya M., and Ikeda M. Dislocation related issues in the degradation of GaN-based laser diodes. IEEE J Sel Top Quantum Electron 10 6 (2004) 1277-1286
9. Nam O.H., Ha K.H., Kwak J.S., Lee S.N., Choi K.K., Chang T.H., et al. Characteristics of GaN-based laser diodes for post-DVD applications. Phys Status Solidi (a) 201 12 (2004) 2717-2720
10. Schoedl T., Schwarz U.T., Kummler V., Furitsch M., Leber A., Miler A., Lell A., et al. Facet degradation of GaN heterostructure laser diodes. J Appl Phys 97 (2005) 123102
11. Meneghini M., Meneghesso G., Trivellin N., Zanoni E., Orita K., Yuri M., et al. Extensive analysis of the degradation of Blu-Ray laser diodes. IEEE Electron Device Lett 9 6 (2008) 578-581
12. van Opdorp C., et al. Method for determining effective nonradiative lifetime and leakage losses in double-heterostructure lasers. J Appl Phys 52 (1981) 3827
13. Schubert E.F. Light emitting diodes (2003), Cambridge University Press
14. Ikeda M., Mizuno T., Takeya M., Goto S., Ikeda S., Fujimoto T., et al. High-power GaN-based semiconductor lasers. Phys Status Solidi (c) 1 6 (2004) 1461-1467