Extensive analysis of the degradation of blu-ray laser diodes

IEEE Electron Device Letters

Volumn 29, Issue 6, 2008, Pages 578-581

  Meneghini, Matteo ^a   Meneghesso, Gaudenzio ^a   Trivellin, Nicola ^a   Zanoni, Enrico ^a   Orita, Kenji ^b   Yuri, Masaaki ^b   Ueda, D Daisuke ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b PANASONIC CORPORATION   (Japan)

Author keywords

Degradation; Gallium nitride; Laser diode (LD); Reliability

Indexed keywords

PHOTODEGRADATION; SEMICONDUCTING GALLIUM COMPOUNDS; THERMAL EFFECTS;

OPTICAL POWER LEVEL; STRESS TESTS;

SEMICONDUCTOR LASERS;

EID: 44849104188     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.921098     Document Type: Article

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