Remarks on some reference materials for applications in elastic peak electron spectroscopy

Analytical Sciences

Volumn 26, Issue 2, 2010, Pages 239-246

  JablonskI, A ^a   Zemek, J ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; ENERGY DISSIPATION;

ELASTIC BACKSCATTERING; ELASTIC ELECTRON BACKSCATTERING; ELASTIC PEAK ELECTRON SPECTROSCOPY; EMISSION ANGLE DEPENDENCE; INELASTIC MEAN FREE PATH; MONTE CARLO CALCULATION; REFERENCE MATERIAL; SURFACE SENSITIVITY;

ELECTRONS;

EID: 77949897091     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.239     Document Type: Article

References (30)

1. Annual Book of ASTM Standards 2004, Vol. 03.06, Standard Terminology Relating to Surface Analysis, Standard E 673-03, ASTM International, West Conshohocken, Pennsylvania, 2004, 814.
2. ISO Standard 18115: Surface Chemical Analysis- Vocabulary, International Organization for Standardization, Geneva, 2001
3. C. J. Powell and A. Jablonski, J. Phys. Chem. Ref. Data, 1999, 28, 19.
4. A. Jablonski, Surf. Sci., 1985, 151, 166.
5. W. Dolinski, H. Nowicki, and S. Mroz, Surf. Interface Anal., 1988, 11, 229.
6. W. Dolinski, S. Mroz, and M. Zagorski, Surf. Sci., 1988, 200, 361.
7. W. Dolinski, S. Mroz, J. Palczynski, B. Gruzza, P. Bondot, and A. Porte, Acta Phys. Pol., A, 1992, 81, 193.
8. P. Mrozek, A. Jablonski, and A. Sulyok, Surf. Interface Anal., 1988, 11, 499.
9. B. Lesiak, A. Jablonski, Z. Prussak, and P. Mrozek, Surf. Sci., 1989, 223, 213.
10. A. Jablonski, B. Lesiak, and G. Gergely, Phys. Scr., 1989, 39, 363.
11. C. J. Powell and A. Jablonski, NIST Electron Inelastic-Mean-Free-Path Database, Version 1.0, Standard Reference Data Program Database 71, U. S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 1999.
12. A. Jablonski, Surf. Interface Anal., 2005, 37, 1035.
13. A. Dubus, A. Jablonski, and S. Tougaard, Prog. Surf. Sci., 2000, 63, 135.
14. A. Jablonski, Prog. Surf. Sci., 2003, 74, 357.
15. A. Jablonski and J. Zemek, Surf. Sci., 2006, 600, 4464.
16. A. Jablonski and F. Salvat, Nucl. Instrum. Methods Phys. Res., Sect. B, 2006, 251, 371.
17. F. Salvat, A. Jablonski, and C. J. Powell, Comput. Phys. Commun., 2005, 165, 157.
18. B. Hahn, D. B. Ravenhall, and R. Hofstadter, Phys. Rev., 1956, 101, 1131.
19. J. B. Furness and I. E. McCarthy, J. Phys. B: At., Mol. Opt. Phys., 1973, 6, 2280.
20. M. P. Seah and S. J. Spencer, Surf. Interface Anal., 2005, 37, 731.
21. A. Jablonski and J. Zemek, Surf. Sci., 2007, 601, 3409.
22. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal., 1991, 17, 911.
23. Y. F. Chen, Surf. Sci., 2002, 519, 115.
24. R. Oswald, Ph. D. Thesis, Fakultät für Physik, EberhardKarls-Universität, Tübingen, 1992.
25. W. S. M. Werner, W. Smekal, C. Tomastik, and H. Störi, Surf. Sci., 2001, 486, L461.
26. N. Pauly and S. Tougaard, Surf. Interface Anal., 2009, 41, 735.
27. J. Zemek, P. Jiricek, A. Jablonski, and B. Lesiak, Surf. Interface Anal., 2002, 34, 215.
28. P. Jiricek, J. Zemek, B. Lesiak, A. Jablonski, and M. Cernansky, J. Vac. Sci. Technol., A, 2002, 20, 447.
29. A. Jablonski, K. Olejnik, and J. Zemek, J. Electron Spectrosc. Relat. Phenom., 2006, 152, 100.
30. S. Chelda, C. Robert-Goumet, B. Gruzza, L. Bideux, and G. Monier, Surf. Sci., 2008, 602, 2114.