SCOPUS 정보 검색 플랫폼

Analytical and Bioanalytical Chemistry

Volumn 396, Issue 5, 2010, Pages 1905-1911

High-resolution investigations of ripple structures formed by femtosecond laser irradiation of silicon

(6) Schade, M a Varlamova, O b Reif, J b Blumtritt, H c Erfurth, W c Leipner, H S a

a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG (Germany)

b BRANDENBURG UNIVERSITY OF TECHNOLOGY (Germany)

c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

Amorphous silicon; Electron microscopy; Laser ablation; Ripple structure

Indexed keywords

ABLATION THRESHOLDS; CRYSTALLINE AND AMORPHOUS SILICON; CRYSTALLINE PHASIS; FEMTOSECOND LASER IRRADIATION; HIGH RESOLUTION; MULTI-SHOT IRRADIATION; PERIODIC MICROSTRUCTURE; RIPPLE STRUCTURE; SELF-ORGANIZED; SEM; SI(1 0 0); SINGLE SHOTS; STRUCTURAL INVESTIGATION; STRUCTURAL MODIFICATIONS; TARGET SURFACE;

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; COMPLEXATION; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IRRADIATION; LASER ABLATION; PULSED LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; ULTRASHORT PULSES;

AMORPHOUS SILICON;

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; LASER; PARTICLE SIZE; SURFACE PROPERTY; TIME;

LASERS; MICROSCOPY, ATOMIC FORCE; MOLECULAR STRUCTURE; PARTICLE SIZE; SILICON; SURFACE PROPERTIES; TIME FACTORS;

EID: 77949264209 PISSN: 16182642 EISSN: 16182650 Source Type: Journal
DOI: 10.1007/s00216-009-3342-3 Document Type: Article

Times cited : (75)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.