Electrical properties of laser-ablation-initiated self-organized nanostructures on silicon surface

Materials Science and Engineering: B

Volumn 134, Issue 2-3 SPEC. ISS., 2006, Pages 114-117

  Reif, Juergen ^a   Ratzke, Markus ^a   Varlamova, Olga ^a   Costache, Florenta ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Laser; Scanning Kelvin probe; Self organization; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ENZYME IMMOBILIZATION; LASER ABLATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY;

ELECTROSTATIC FORCE MICROSCOPY (EFM); SCANNING KELVIN PROBE; SELF ORGANIZED NANOSTRUCTURES; SILICON SURFACE;

SILICON;

EID: 33750334540     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.07.030     Document Type: Article

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